2022
DOI: 10.1016/j.renene.2021.09.035
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Simulation of heat loss in Cu2ZnSn4S Se4− thin film solar cells: A coupled optical-electrical-thermal modeling

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Cited by 31 publications
(11 citation statements)
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“…Interestingly, the benchmarked solar cell shows the highest PCE of ∼30.57% at an N A of ∼10 16 cm –3, and decreases sharply with an increase in acceptor density, reaching ∼1.30% at an N A of ∼10 21 cm –3 . It is reasonable to infer that maximum electron and hole separation happens at N A ∼ 10 16 cm –3 because, at this point hole, the Fermi energy level approaches the highest valence band, thus increasing the open circuit voltage and short circuit current density as well, , while the probability of the recombination process increases with the increase in acceptor density and thus impedes the PV efficiency of the solar cell device. In addition, the PCE increases from 26.41 to 30.57% as E t increases from 0.1 to 1.60 eV and thereafter remains unchanged.…”
Section: Resultsmentioning
confidence: 99%
“…Interestingly, the benchmarked solar cell shows the highest PCE of ∼30.57% at an N A of ∼10 16 cm –3, and decreases sharply with an increase in acceptor density, reaching ∼1.30% at an N A of ∼10 21 cm –3 . It is reasonable to infer that maximum electron and hole separation happens at N A ∼ 10 16 cm –3 because, at this point hole, the Fermi energy level approaches the highest valence band, thus increasing the open circuit voltage and short circuit current density as well, , while the probability of the recombination process increases with the increase in acceptor density and thus impedes the PV efficiency of the solar cell device. In addition, the PCE increases from 26.41 to 30.57% as E t increases from 0.1 to 1.60 eV and thereafter remains unchanged.…”
Section: Resultsmentioning
confidence: 99%
“…is electron (hole) mobility, and D n(p) is the diffusion coefficient of electrons (holes), which is related to q, μ, Boltzmann constant (k) and temperature (T) via D = μkT/q equation. Moreover, the appropriate non-radiative recombination mechanisms are SRH (generation-recombination» trap-assisted recombination) and Auger recombination models, which are defined as [33]:…”
Section: Modelling and Numerical Simulationmentioning
confidence: 99%
“…Joule heating is an internal heat source when an electrical current passes through a resistive medium [118]. Peltier heat refers to the dissipation of heat at the interface between metal and semiconductor is an additional factor that contributes to the formation of internal heat and impacts the performance of the cells [119,120]. Because the internal heat suffers from a wide range of intrinsic defects reproduced, including atomic vacancy, interstitials, and lattice distortion replacements, including wider dimensionality imperfections present in perovskite films are also a significant element influencing the durability and efficiency of PSCs [121].…”
Section: Internal Heatmentioning
confidence: 99%