Articles you may be interested inA Pt-Ti-O gate Si-metal-insulator-semiconductor field-effect transistor hydrogen gas sensor Effects of interface states and temperature on the C -V behavior of metal/insulator/AlGaN/GaN heterostructure capacitors Sulfur surface chemistry on the platinum gate of a silicon carbide based hydrogen sensorThe influence of mass transport processes on the response to gas mixtures of field-effect devices with large-area catalytic metal gatesThe hydrogen response of gas-sensitive field-effect devices is mainly due to trapping of atomic hydrogen on the insulator side of the metal-insulator interface of the metal-insulator-semiconductor ͑MIS͒ structure. Therefore an influence of the choice of insulator on the hydrogen response properties is expected. We have investigated this influence by producing MIS capacitors with four different insulators; SiO 2 , Al 2 O 3 , Si 3 N 4 , and Ta 2 O 5 . The results show that the choice of insulator influences the detection limit, the saturation concentration, and the saturation response. Furthermore, there is a strong correlation between the observed saturation response and the oxygen concentration of the insulator surface, as measured by Auger electron spectroscopy, which indicates that the trapping of hydrogen at the interface occurs at the oxygen atoms of the insulator surface. Finally, if the metal film is porous a catalytic oxidation of the insulator surface appears to be facilitated, which can increase the hydrogen response.