2006
DOI: 10.1016/j.sna.2005.08.038
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Simulation of SiO2-based piezoresistive microcantilevers

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Cited by 36 publications
(18 citation statements)
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“…(iii) Generally, the influence of isolation and immobilization layers on the device performance is ignored by various researchers primarily to reduce the computational complexity. 15,24,42,43 In the present work, we have included these layers and have numerically analyzed their influence on the thermo-electro-mechanical response of the sensor. (iv) All the above mentioned analyses were carried out at fixed cantilever dimensions.…”
Section: B Simulation Methodologymentioning
confidence: 99%
“…(iii) Generally, the influence of isolation and immobilization layers on the device performance is ignored by various researchers primarily to reduce the computational complexity. 15,24,42,43 In the present work, we have included these layers and have numerically analyzed their influence on the thermo-electro-mechanical response of the sensor. (iv) All the above mentioned analyses were carried out at fixed cantilever dimensions.…”
Section: B Simulation Methodologymentioning
confidence: 99%
“…In order to verify the simulation results, a 2D analytical solution was obtained for a 200 lm 9 100 lm 9 2 lm bilayer plate (Burgreen 1971). The analytical model assumed that equal thickness polymer and silicon constitute a bilayer plate with polymer perfectly bonded to the substrate along the entire interface area.…”
Section: Modelingmentioning
confidence: 99%
“…Reports about the design and simulations of a piezoresistive micro-cantilever platform based on CoventorWare ® , a commercial finite element analysis (FEA) tool designed specifically for MEMS applications 12 . Placements of polysilicon piezoresistors are crucial and their placement is optimised to measure differential surface stress caused due to adsorption of any bio-molecule on the functionalised layer.…”
Section: Introductionmentioning
confidence: 99%
“…The adsorption of any bio-molecule takes place on the functionalised layer of sense micro-cantilever which causes a differential surface stress resulting in the bending of microcantilever beam 12,13 , which is here detected by the polysilicon piezoresistors. Sense micro-cantilever is connected with the reference micro-cantilever (devoid of functionalisation layer) in a Wheatstone bridge configuration to obtain an output voltage.…”
Section: Introductionmentioning
confidence: 99%