IEEE 14th Topical Meeting on Electrical Performance of Electronic Packaging, 2005.
DOI: 10.1109/epep.2005.1563769
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Simulation of switching noise in on-chip power distribution networks of FPGAs

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Cited by 5 publications
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“…While the spatial distribution of dynamic power consumption can usually be estimated at design time, or in some cases at runtime using performance counters, it is often not known how the dynamic power maps to IR drop. With FPGA-based systems, the power grid has irregularities and discontinuities [Lalgudi et al 2005], and the details are proprietary, preventing accurate simulation. Moreover, with certain systems even the dynamic power profile may not be well understood, due to changes in workload or autonomously generated configurations.…”
Section: Switching-induced Ir Dropmentioning
confidence: 99%
“…While the spatial distribution of dynamic power consumption can usually be estimated at design time, or in some cases at runtime using performance counters, it is often not known how the dynamic power maps to IR drop. With FPGA-based systems, the power grid has irregularities and discontinuities [Lalgudi et al 2005], and the details are proprietary, preventing accurate simulation. Moreover, with certain systems even the dynamic power profile may not be well understood, due to changes in workload or autonomously generated configurations.…”
Section: Switching-induced Ir Dropmentioning
confidence: 99%
“…As transistor feature sizes scale down into the nano-regime, cmos circuits become increasingly susceptible to error due to noise [6,8,24,25]. Judging by itrs projections for future supply voltages and thermal, switching, and cross-talk noise levels projected to be present, the noise to signal ratio (nsr)-previously defined by Cheemalavagu et.…”
Section: Future Technologies and Noisementioning
confidence: 99%
“…al [26]will be high enough to cause significant errors by 2016 [9]. For example, switching noise, also known as power supply noise, is as high as 30mV [6] in current technology. Furthermore, as studied by Elgamel [25], cross talk can be as high as 1.4V when power and ground lines are not used to shield interconnect.…”
Section: Future Technologies and Noisementioning
confidence: 99%
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