Simulation of vibrational resonances of stiff AFM cantilevers by finite element methods

Espinoza‐Beltrán, F.J.; Geng, Kun; Muñoz-Saldaña, J.; Rabe, U.; Hirsekorn, S.; Arnold, W.

doi:10.1088/1367-2630/11/8/083034

Cited by 44 publications

(26 citation statements)

References 26 publications

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“…The frequency shift can be followed starting from the very beginning of the cantilever interaction with the surface and with good temporal resolution. The single measure is taken in approximately 100 ms. With an appropriate analysis, it would be possible to study in detail both the adhesion forces dynamics of the cantilever (Espinosa-Beltrán et al, 2009;Yamanaka & Nakano, 1998) and the elasticity parameters (e.g the Young's modulus) from the contact region (Hertz contact dynamics) (Dupas et al, 2001;Espinosa-Beltrán et al, 2009;Rabe et al, 1996;Vairac et al, 2003).…”

Section: Contact Dynamic Force Spectroscopymentioning

confidence: 99%

“…The peak at 239.4 kHz with Q=310 is the first torsional mode (t 1 ). The mode at 210.2 kHz with Q=590 is the first lateral bending mode (l 1 ) (Espinosa-Beltrán et al, 2009). The lateral modes are cantilever in-plane flexural modes, in contrast with the usual out-of-plane flexural modes.…”

Section: Torsional Modesmentioning

confidence: 99%

“…With a suitable model this technique could allow a thorough measurement of the adhesion force properties (Drobek et al, 2001;Espinosa-Beltrán et al, 2009;Yamanaka & Nakano, 1998). Analytical and numerical models describing the free cantilever-vibration as well as the contact-resonances are well known and provide quantitative evaluation when complete contact-resonance spectra are measured.…”

Section: Torsional Modesmentioning

confidence: 99%

“…The damped oscillator boxes for the same modes are 0.41 ms × 0.77 kHz (t 1 ) and 0.90 ms × 0.35 kHz (l 1 ). Thus the frequency width of the time-frequency distribution is limited by the wavelet resolution (the frequency width of the Heisenberg box) which is much higher than the frequency width of the oscillator box (see (Butt & Jaschke, 1995;Espinosa-Beltrán et al, 2009) free cantilever resonant frequencies. The theoretical results are expressed as ratios with respect to the first flexural frequency, f 1 = 10.908 kHz.…”

Section: Torsional Modesmentioning

confidence: 99%

See 3 more Smart Citations

Wavelet Transforms in Dynamic Atomic Force Spectroscopy

Malegori¹,

Ferrini²

2012

Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale

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Section: Contact Dynamic Force Spectroscopymentioning

confidence: 99%

Section: Torsional Modesmentioning

confidence: 99%

Section: Torsional Modesmentioning

confidence: 99%

Section: Torsional Modesmentioning

confidence: 99%

See 2 more Smart Citations

Wavelet Transforms in Dynamic Atomic Force Spectroscopy

Malegori¹,

Ferrini²

2012

Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale

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“…However, the fundamental question remains with respect to the design of a new AFM probe. Numerical simulation of vibrational resonances of stiff atomic force microscope cantilevers made of silicon by finite element methods (FEM) for application in contact-resonance spectroscopy was reported by Espinoza -Beltran et.al [6]. The FEM model considers the cubic symmetry of silicon single crystals and the geometrical shape of the cantilevers with a trapezoidal cross section and a triangular free end.…”

Section: Introductionmentioning

confidence: 99%

A Tribological Simulation for a Typical Carbon Coated AFM Cantilever Interacting with a Monolayer Graphene Sheet

et al. 2018

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Abstract. This study aims on the dynamic and tribological characterization of a Single Layer Graphene Sheet (SLGS) including the effects of a graphene cantilever's deflection. A 10 x 10 nm graphene model is developed, which is modally analyzed for both Zigzag and Armchair lattices. A typical Atomic Force Microscope (AFM) cantilever with carbon coated tip is also modeled during the simulation. The friction forces applied on the tip during its movement can be evaluated. The real contact area is characterized as the carbon atom tip is interlinked with the graphene atoms via the Lennard-Jones model. This study confirmed that the deformation of the AFM cantilever, is important to predict more accurately the tribological behaviour of graphene and the effect of its lattice orientation to its frictional properties. Therefore, this simulation provides an interesting way to understand the complex interaction between the cantilever tip and the sample in different contact conditions.

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Resonance tracking atomic force acoustic microscopy quantitative modulus mapping of carbon nanotubes‐reinforced acrylonitrile–butadiene–styrene polymer

Flores-Ruiz

Luis²,

Chiñas‐Castillo³

et al. 2014

J of Applied Polymer Sci

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This work presents a resonance tracking atomic force acoustic microscopy (RT‐AFAM) quantitative modulus mapping of carbon nanotubes‐reinforced acrylonitrile–butadiene–styrene polymer. RT‐AFAM average local modulus values registered were in good agreement with those measured by nanoindentation test. RT‐AFAM mapping modulus, nanoindentation, and transmission electron microscopy imaging showed that carbon nanotubes reinforcement of acrylonitrile–butadiene–styrene polymer matrix gives an elastic modulus enhancement of approximately 18.3% compared with the polymer matrix alone and showed that this technique provides high spatial resolution and helps to characterize the elastic properties of reinforced thermoplastic polymers and new compound materials at nanoscale. © 2014 Wiley Periodicals, Inc. J. Appl. Polym. Sci. 2014, 131, 40628.

show abstract

Simulation of vibrational resonances of stiff AFM cantilevers by finite element methods

Cited by 44 publications

References 26 publications

Wavelet Transforms in Dynamic Atomic Force Spectroscopy

Wavelet Transforms in Dynamic Atomic Force Spectroscopy

A Tribological Simulation for a Typical Carbon Coated AFM Cantilever Interacting with a Monolayer Graphene Sheet

Resonance tracking atomic force acoustic microscopy quantitative modulus mapping of carbon nanotubes‐reinforced acrylonitrile–butadiene–styrene polymer

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