Simulation of X-ray diffraction-line broadening due to dislocations in a model composite material

Bor, Teunis Cornelis; Cleveringa, H.H.M.; Delhez, R.; Giessen, E. van der

doi:10.1016/s0921-5093(00)01648-8

Cited by 5 publications

(3 citation statements)

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“…The major theoretical works cannot account for the asymmetric diffraction peak broadening often observed experimentally. This phenomenon can be understood by the quasi-composite model (Unga Â r et al, 1984;Bor et al, 2001), or by the presence of stacking faults (Gaa Â l, 1984). It was shown that the Fourier coef®cients are closely related to the deformation state of the microstructure.…”

Section: X-ray Line Broadeningmentioning

confidence: 99%

“…Some authors describe the diffraction line from the results of dislocation dynamics computations for speci®c dislocation distributions (Bor et al, 2001). Other methods are based on the statistical aspects of this distribution.…”

Section: X-ray Line Broadeningmentioning

confidence: 99%

“…The need for relating the deformation to the dislocation density appears obvious for the line broadening analysis. Theoretical investigations of the XRD line pro®les of crystals containing dislocation distributions have been presented by Krivoglaz & Rayboshapka (1963), Wilkens (1979), Klimanek & Kuzel (1988), Klimanek (1989), Van Berkum et al (1993, Krivoglaz (1996), Groma (1998) and Bor et al (2001).…”

Section: Introductionmentioning

confidence: 99%

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Periodic dislocation configuration analysis by lattice distortion evaluation: micromechanical approach and X-ray diffraction line broadening

et al. 2004

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This work concerns dislocation microstructure analysis in order to assess stored elastic energy using Fourier coefficients of diffraction lines. These coefficients are related to the lattice distortion heterogeneity evaluated using a micromechanical approach. The lattice distortion formulation is based on dislocation density and Green's function tensors. The first tensor, which is a state quantity, characterizes the distortion incompatibility, while the second one characterizes the interaction phenomena between spatial positions. The proposed approach considers a given dislocation configuration in order to calculate the exact associated fields in a deterministic way. Periodic dislocation distributions were examined and the lattice distortion was calculated as a function of the distance H between two successive dislocations (dislocation density). A short‐range interaction effect was found for two values: H = 50 and 100 Å. Then Fourier coefficients of {h00}, {hhh} and {hkl} diffraction lines were estimated. It was observed that the sensitivity of the Fourier coefficients to H depends strongly on the choice of the diffraction vector. Since the dislocation configurations were crystallographically defined, the contrast factor is included directly in our approach. For the considered slip system, it is shown that the screw periodical distribution has a higher Fourier coefficient variation than the periodical edge dislocations.

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Section: X-ray Line Broadeningmentioning

confidence: 99%

Section: X-ray Line Broadeningmentioning

confidence: 99%