2006
DOI: 10.1007/11779568_119
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Simulation Studies of Two-Layer Hopfield Neural Networks for Automatic Wafer Defect Inspection

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Cited by 5 publications
(1 citation statement)
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“…Meanwhile, it has no damaged advantages of image pixels characteristics and pixel dots surrounding structure information. Chang [3] and others suggested applying self-organizing neural network (SONN) and Hopfield neural network (HNN) two kinds of algorithms to detect the defected location in wafer images, which have a very good application effect of detection. We also proved that the image processing is not affected by the amplification.…”
Section: Introductionmentioning
confidence: 99%
“…Meanwhile, it has no damaged advantages of image pixels characteristics and pixel dots surrounding structure information. Chang [3] and others suggested applying self-organizing neural network (SONN) and Hopfield neural network (HNN) two kinds of algorithms to detect the defected location in wafer images, which have a very good application effect of detection. We also proved that the image processing is not affected by the amplification.…”
Section: Introductionmentioning
confidence: 99%