Simulation study on the defect detection for the epoxy insulators via the infrared thermal imaging

Li, Bo; Jie, Bai; Fan, Lei; Zheng, Ruifeng; Zhao, Xuetong; Ma, Tianci

doi:10.1109/ichve61955.2024.10676100

2024 IEEE International Conference on High Voltage Engineering and Applications (ICHVE) 2024

DOI: 10.1109/ichve61955.2024.10676100

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Simulation study on the defect detection for the epoxy insulators via the infrared thermal imaging

Bo Li,

Bai Jie,

Lei Fan

et al.

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Simulation study on the defect detection for the epoxy insulators via the infrared thermal imaging

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References 12 publications

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