Simultaneous amorphization at interfaces and grain boundaries in an Ni/Ti multilayer

Hollanders, Marcus Antonius; Thijsse, Barend J.

doi:10.1016/0022-3093(90)90624-u

Cited by 15 publications

(2 citation statements)

References 5 publications

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“…1 a). However, very recently we have obtained evidence that at least for Ni-Ti [4,5] and Ni-Ta [6] this model is an oversimplification. Firstly, it was observed that amorphization occurs not only along the interfaces between the sublayers, but also along the grain boundaries in the sublayers (Fig.…”

Section: Introductionmentioning

confidence: 99%

A model for interdiffusion in polycrystalline multilayers and its application to solid state amorphization

Hollanders

Thijsse

Mittemeijer

1991

Phys. Stat. Sol. (a)

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A model is developed for analysing growth of intermediate (amorphous) phase and formation of solid solution along both the interfaces and the grain boundaries in multilayers. The model is valid up to moderate stages of isothermal annealing, when the multilayer can be conceived as a stack of infinite diffusion couples. Continued amorphization along the grain boundaries implies that fast diffusion paths remain active in the amorphous phase. The model is applied to experimental data obtained for Ni–Ti and Ni–Ta multilayers, showing solid state amorphization and solid solution formation. The chemical diffusion coefficient of the amorphous phase, Dam, is much smaller in the Ni–Ta system than in the Ni–Ti system, resulting in (i) less amorphization, and (ii) a much larger ratio of the grain‐boundary diffusion coefficient, Dgb, and Dam in Ni–Ta.

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Section: Introductionmentioning

confidence: 99%

A model for interdiffusion in polycrystalline multilayers and its application to solid state amorphization

Hollanders

Thijsse

Mittemeijer

1991

Phys. Stat. Sol. (a)

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“…[3][4][5] A multilayer can be regarded as a one-dimensional single crystal with the lattice constant given by the adjustable multilayer period d perpendicular to the surface. [7][8][9][10][11] One of the major problems in realizing a truly monochromatic beam is higher-order reflections from multilayers as well as from single crystals. 6 Due to their high scattering length density contrast for neutrons, often Ni and Ti are selected as layer materials nowadays.…”

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confidence: 99%

Multilayers with tailored blurred interfaces

Padiyath¹,

Stahn²,

Horisberger³

et al. 2006

Applied Physics Letters

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Monochromators used in neutron or x-ray experiments often have higher-order contributions, which have to be reduced by filters. Multilayer monochromators produced by dc-magnetron sputtering, with intentionally blurred interfaces, have reduced these higher-order contributions. The approach is to substitute the bilayer structure by several layers with individual thicknesses per period. A Ni∕Ti monochromator was prepared where higher-order contributions were reduced below 0.1% of the first-order reflectivity of 93% (measured up to the seventh order). In order to determine the lifetime of such a structure, the interdiffusion of the constituents was measured with thermal annealing (interface diffusion activation energy: 0.16(1)eV).

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Solid state amorphization reactions in Ni/Ti multilayer composites prepared by cold rolling

Shen¹,

Quan²,

Wang³

1993

JOURNAL OF MATERIALS SCIENCE

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Simultaneous amorphization at interfaces and grain boundaries in an Ni/Ti multilayer

Cited by 15 publications

References 5 publications

A model for interdiffusion in polycrystalline multilayers and its application to solid state amorphization

A model for interdiffusion in polycrystalline multilayers and its application to solid state amorphization

Multilayers with tailored blurred interfaces

Solid state amorphization reactions in Ni/Ti multilayer composites prepared by cold rolling

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