Single-mode tapered optical fibers (TOF) are well-known
for applications
in sensing. In this work, we demonstrate the use of tapered optical
fibers to detect charged particles (ions) irradiated at various energies,
fluences, and species. In this experiment, two different ion species,
namely, Ar+ and N+, have been used to irradiate
tapered optical fibers at various fluences and energies. The variations
in the free spectral range (FSR), period, and transmission power loss
from the ion beam irradiated TOFs are picked up by the optical spectrum
analyzer (OSA). We were able to identify ions with energy as low as
80 keV because of the change in the refractive index of the cladding
material caused by the implanted ions. The observed changes in spectra
are explained using the results of COMSOL simulations. Using Monte
Carlo-based TRI3DYN ion–solid interaction simulation, the surface
modification and defect formation caused by ion beams as well as the
implantation profile in the TOF have been predicted. These results
are further corroborated by experimental studies such as scanning
electron microscopy and Raman scattering spectroscopy. Such a tapered
optical fiber-based detection method will aid in the creation of portable
equipment to identify charged particles in nuclear reactors and in
space exploration.