Single-board computer low-energy electron diffraction intensity measuring apparatus

Abstract

A very simple printed circuit board attached to a single-board microcomputer for low-energy electron diffraction (LEED) intensity measurement is developed. The principle and the block diagram are given. Some preliminary experimental results of I–E curves of Si(111)-(7×7) and V(100)-(2×2) are given. The angular profiles of the integral spot of Si(111)-(7×7) under different primary electron energies are given, from which the instrument response of our LEED gun is calculated.