2021
DOI: 10.1515/znb-2021-0024
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Single-crystal structures of A 2SiF6 (A = Tl, Rb, Cs), a better structure model for Tl3[SiF6]F, and its novel tetragonal polymorph

Abstract: We report on the syntheses and single-crystal structure determinations of the compounds A 2SiF6 (A = Tl, Rb, Cs). In comparison to the previous powder-based structure models we achieved more precise atom positions and distances. The compounds crystallize in the K2PtCl6 structure type, space group Fm 3 ‾ … Show more

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Cited by 8 publications
(4 citation statements)
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“…The F–Si–F angles within the anion are almost ideal with 89.95(11)°, 89.95(9)°, 90.05(9)°, and 90.05(11)°. These Si–F bond lengths agree with those of [NH 4 (NH 3 ) 2 ] 2 [SiF 6 ] [1.652(2)–1.692(2) Å], K 2 [SiF 6 ] [1.683(2)–1.706(9) Å], Rb 2 [SiF 6 ] [1.693(3) Å], Tl 2 [SiF 6 ] [1.686(6) Å], and Cs 2 [SiF 6 ] [1.679(4) Å], KLi­[SiF 6 ] [1.676(1)–1.701(1) Å], CsLi­[SiF 6 ] [1.667(2)–1.699(2) Å], and (NH 4 ) 2 [SiF 6 ] [1.688(3) Å] …”
Section: Results and Discussionsupporting
confidence: 70%
“…The F–Si–F angles within the anion are almost ideal with 89.95(11)°, 89.95(9)°, 90.05(9)°, and 90.05(11)°. These Si–F bond lengths agree with those of [NH 4 (NH 3 ) 2 ] 2 [SiF 6 ] [1.652(2)–1.692(2) Å], K 2 [SiF 6 ] [1.683(2)–1.706(9) Å], Rb 2 [SiF 6 ] [1.693(3) Å], Tl 2 [SiF 6 ] [1.686(6) Å], and Cs 2 [SiF 6 ] [1.679(4) Å], KLi­[SiF 6 ] [1.676(1)–1.701(1) Å], CsLi­[SiF 6 ] [1.667(2)–1.699(2) Å], and (NH 4 ) 2 [SiF 6 ] [1.688(3) Å] …”
Section: Results and Discussionsupporting
confidence: 70%
“…Bond valence calculations indicate that the oxidation state of Se(1) is 3.958. The oxidation state of Si(1) is 4.513, which is relatively elevated and commonly observed in hexafluoro silicate compounds, such as compounds KLiSiF 6 (Si: 4.496), 48 Tl 2 SiF 6 (Si: 4.506) 49 and Li 2 SiF 6 (Si: 4.518). 50 Given that it is not an isolated case, we believe the high bond valence may be caused by the overestimated bond valence parameter (1.58) for the Si 4+ –F bond.…”
Section: Resultsmentioning
confidence: 99%
“…From top to bottom, the diffractograms of hexagonal KRbSiF 6 , cubic K 2 SiF 6 , cubic KRbSiF 6 , and cubic Rb 2 SiF 6 doped with 0.5% Mn 4+ are shown. Below the experimental patterns, the reference patterns are plotted. ,, Note that these diffractograms are recorded using a Co X-ray source.…”
Section: Resultsmentioning
confidence: 99%
“…Below the experimental patterns, the reference patterns are plotted. 9,21,22 Note that these diffractograms are recorded using a Co X-ray source. components allow for breaking the parity selection rule.…”
Section: ■ Results and Discussionmentioning
confidence: 99%