2013 IEEE Radiation Effects Data Workshop (REDW) 2013
DOI: 10.1109/redw.2013.6658208
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Single Event Characterization of a Family of Voltage Supervisors Designed in a 0.35-µm Triple-Well CMOS Technology

David B. Kerwin
1
,
Younes Lotfi
2
,
A. Zanchi
3
et al.
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