Single event effect flight data analysis of multiple NASA spacecraft and experiments; implications to spacecraft electrical designs

Seidleck, C.M.; LaBel, Kenneth A.; Moran, A.K.; Gates, Michele; Barth, J.L.; Stassinopoulos, E. G.; Gruner, T.

doi:10.1109/radecs.1995.509840

Cited by 15 publications

(6 citation statements)

References 12 publications

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“…The model of a "thin sensitive layer" is experimentally confirmed for many VLSIC manufactured using the planar technology, as well as invariance of function σ(L ef ) with respect to the angle of incidence on the 3 …”

Section: Cross Section Of Single Event Effectsmentioning

confidence: 69%

“…At the present time, the effect of SEU occurrence in memory cells of RAM onboard spacecraft is confirmed by numerous flight experiments. The list of the best known such experiments [2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17] is given in the Table. In several years after discovering SEU in memory microchips onboard spacecraft, the SEU effect associated with the influence of separate HCP was observed in RAM microchips of the dynamic memory [18]. It was found that in this case SEU were induced by alphaparticles of radioactive isotopes contained in the substance of microchip packages.…”

Section: Introductionmentioning

confidence: 99%

“…EXOS -D Japan [11] MOS -1 Japan [12] ETS -V Japan [12] ETS -VI Japan [12] ADEOS Japan [12] Meteor-3 (TOMS) USA [3] Mir (EXEQ) France [13] ELEKTRO-1 Russia [14] INTERBALL-2 Russia [15] MPTB USA [16] SAC -C (ICARE) France [17] The above effects become a cause of appearance of both intermittent failures (malfunctions) and permanent failures of VLSIC in electronic systems of control, and systems of data acquisition and storage onboard spacecraft. There are different circuit-analysis, algorithmic, and program methods in order to minimize such failures and to exclude their influence when functional tasks are executed.…”

Section: Introductionmentioning

confidence: 99%

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The Rate of Single Event Upsets in Electronic Circuits onboard Spacecraft

Кузнецов

2005

Cosmic Res

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Models and methods in use for quantitative estimates of the occurrence of single event upsets in microchips of orbiting spacecraft are considered. A calculation and experimental technique for determining the rate of these effects is described, taking into account spatial and temporal distributions of the fluxes of highenergy particles in the space and their penetration through protective shields. Examples of its application for the orbit of the International Space Station are presented. Space vehicles (instrumentation modules) used for studying single event inversions of memory cells of RAM VLSIC SpacecraftCountry of instrumentation design References

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Section: Cross Section Of Single Event Effectsmentioning

confidence: 69%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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The Rate of Single Event Upsets in Electronic Circuits onboard Spacecraft

Кузнецов

2005

Cosmic Res

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“…Based on SRAM, FPGA tends to be damaged by space radiation, so OBC reliability design aims at FPGA mainly [14]. In the space, the electronic device is threatened by two kinds of effort: Single Event Effect (SEE) [15] and Total Ionizing Dose (TID) effect. SEE includes several effects, and two of them are very marked: Single Event Upset (SEU) and Single Event Latch-up (SEL).…”

Section: ) Function Reconfiguration ： Function Reconfigurationmentioning

confidence: 99%

Run-time control design of micro-satellite OBC based on reconfigurable architecture

Zhao

Shi-jie³

et al. 2009

2009 4th IEEE Conference on Industrial Electronics and Applications

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To address the issues of On-Board Computer (OBC) design by traditional method for micro-satellite, an advanced OBC based on reconfigurable architecture was presented, and its run-time control scheduling was designed. This reconfigurable OBC could implement supervision which ensured the running status, function reconfiguration which switched its current control modes, restoring reconfiguration through searching and shielding the problem region, and software/hardware upgrading reconfiguration which could accomplish in orbit. Semi-physical simulation platform composed with OBC prototype board, DSpace simulator and laboratory terminal was established, then the performance and run-time control scheduling of this OBC was proved in the platform.

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“…The SEE is more effective on memories such as Static Random Access Memory (SRAM). These SEE are not new, and many researchers have diagnosed these effects in the space environment [1], [2]. These effects are more effective in memories, and many researchers worked on the methods to avoid these effects on hardware and software [3]- [5].…”

Section: Introductionmentioning

confidence: 99%

Single Event Effects Tolerant AES-CTR Implementation for Authentication of Satellite Communication

Pirzada¹,

Murtaza²,

Liu³

et al. 2019

IJCCE

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Recently, the increase in the use of fast and reliable communication systems has increased the significance and utilization of satellite-based communication systems. The communication systems used in the space environment is more reliable and robust as compared to communication systems used on earth. Because unlike ground communication, the communication systems in space have to bear harsh space environment and its effects like radiations, pressure, and vacuum, which causes anomalies in communication systems. These effects are known as Single Event Effects (SEE), which results in loss of data or sometimes even damage to the equipment. Like ground systems, in satellite, the Advanced Encryption Standard (AES) is a widely used encryption algorithm which is not only used to provide data confidentiality but also used in data authentication & integrity algorithms (e.g. CMAC) as well as in authenticated encryption (AE) algorithm (e.g., AES-GCM). The Substitution Box (S-Box) is a main component of the AES algorithm, which is generally implemented on memory blocks. The memory blocks in space are vulnerable to radiations and mostly affected by SEE; hence, protection techniques against SEE are proposed by researchers. Two methods for implementation of the S-Box algorithm are by a look-up table or by an algorithm. In this work, analysis of using these two methods of the S-Box implementation for SEE is performed. The implementation of both methods is performed on FPGA, and results show that the algorithm implementation is more reliable in the space environment as compared to table-based implementation.

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Single event effect flight data analysis of multiple NASA spacecraft and experiments; implications to spacecraft electrical designs

Abstract: A bsfractWe present the spaceflight Single Event Effect (SEE) data for the emerging comniercial technologies utilized in multiple NASA spacecraft and experiments. Analyses of device performance as well as design implications of the flight results are discussed.

Cited by 15 publications

References 12 publications

The Rate of Single Event Upsets in Electronic Circuits onboard Spacecraft

The Rate of Single Event Upsets in Electronic Circuits onboard Spacecraft

Run-time control design of micro-satellite OBC based on reconfigurable architecture

Single Event Effects Tolerant AES-CTR Implementation for Authentication of Satellite Communication

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