2003 IEEE Radiation Effects Data Workshop
DOI: 10.1109/redw.2003.1281346
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Single event effects results for candidate spacecraft electronics for NASA

Abstract: Abstract-We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects. Devices tested include digital, analog, linear bipolar, and hybrid devices, among others.

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Cited by 9 publications
(3 citation statements)
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“…Volts active bias and 10 6 ions per second heavy ion irradiation. These radiation levels corresponded to ones that have caused electronic upsets in conventional circuits during 78 Kr irradiation 14 .…”
Section: Results From Nanocircuit Experimentsmentioning
confidence: 64%
“…Volts active bias and 10 6 ions per second heavy ion irradiation. These radiation levels corresponded to ones that have caused electronic upsets in conventional circuits during 78 Kr irradiation 14 .…”
Section: Results From Nanocircuit Experimentsmentioning
confidence: 64%
“…The TMP36 have shown a previous good behavior against Singel Event Effects (SEE) [9]. However, this strong variation of its behavior against TID needs to be taken into consideration for its future use in space missions.…”
Section: Tmp36mentioning
confidence: 99%
“…This voltage deviation or pulse is known as a single-event transient (SET) [1]- [42]. Over the years, there have been several attempts to categorize the SET response of analog devices [43]- [59].…”
Section: Introductionmentioning
confidence: 99%