Single Event Effects Testing on the SERDES, Fabric Flip-Flops and PLL in a Radiation-Hardened Flash-Based FPGA-RT4G150

Wang, Jih-Jong; Dsilva, Durwyn; Rezzak, Nadia; Varela, Stephen; Cui, Shiying

doi:10.1109/nsrec.2016.7891741

Cited by 5 publications

(1 citation statement)

References 2 publications

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“…Table1 clearly summarizes the results of the UART, Ethernet and USB communication tests. The SEE events can be divided into three types [16][17][18][19][20][21]: SEFI, program corrupt (PC) and SEU, as shown below：…”

Section: Analysis Of Experimental Resultsmentioning

confidence: 99%

Single event effect evaluation of different communication ways based on 40nm SRAM-FPGA

Zhao

et al. 2023

Third International Conference on Artificial Intelligence and Computer Engineering (ICAICE 2022)

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Field-programmable gate array (FPGA) is now considered by an increasing number of designers in various fields of application, such as space and aircraft embedded control systems, image and signal processing. It is a popular way to design different serial communication protocols including serial and network communications implemented by FPGA, which ensure data transfer accuracy and timing. However, single event effects (SEE) can pose a serious threat to the reliability of FPGA in the radiation environments. In order to evaluate the reliability and failure modes of different communication interfaces in radiation environments, three communication protocols were tested by alpha radiation source, including universal asynchronous receiver/transmitter (UART), ethernet, and universal serial bus (USB). The experiments have presented the failure modes and SEE cross sections to different communication ways.

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