Single event transient hardened delay cell for a differential ring VCO

Karthigeyan, K.A.; Radha, S.

doi:10.1016/j.microrel.2020.113721

Cited by 3 publications

(3 citation statements)

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“…Mitigating harmonic errors induced by the SET in a single ended inverter ring-based oscillator was proposed in [9]. Similarly, the SET effect on differential ring VCOs were studied in [10][11][12]. A new SET-H CDC delay cell for the DRVCO was proposed to reduce the SET sensitivity in [12].…”

Section: Introductionmentioning

confidence: 99%

“…Similarly, the SET effect on differential ring VCOs were studied in [10][11][12]. A new SET-H CDC delay cell for the DRVCO was proposed to reduce the SET sensitivity in [12].…”

Section: Introductionmentioning

confidence: 99%

“…This phase displacement causes interference in transceivers and data loss in communication links. Several studies have focussed on the hardening of the VCOs for radiation environments [5][6][7][8][9][10][11][12]. The Triple modular redundancy (TMR) technique is a widely adopted approach to prevent SEEs in PLL circuits [5,6].…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Single event transient mitigation techniques for a cross‐coupled LC oscillator, including a single‐event transient hardened CMOS LC‐VCO circuit

Karthigeyan¹,

Radha²,

Manikandan

2021

IET Circuits, Devices & Syst

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Single-event transients (SETs) due to heavy-ion (HI) strikes adversely affect the electronic circuits in the sub-100 nm regime in the radiation environment. This study proposes techniques to mitigate SETs in CMOS voltage-controlled oscillators (VCOs) without affecting the circuit specifications. A circuit asymmetry technique is used for faster recovery of the oscillator in the event of a single event transient (SET) caused by an ion hit. Also, a new SET tolerant inductor capacitor-voltage controlled oscillator (LC-VCO) topology is proposed for a radiation environment that shows reduced phase displacement, amplitude displacement, and recovery time. A comparison has been made with various LC-VCOs that have an inherent rad-hard capability which proves a significant improvement in SET sensitivity. K E Y W O R D S radiation hardening (electronics), voltage-controlled oscillatorsThis is an open access article under the terms of the Creative Commons Attribution-NonCommercial License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited and is not used for commercial purposes.

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Section: Introductionmentioning

confidence: 99%

“…Similarly, the SET effect on differential ring VCOs were studied in [10][11][12]. A new SET-H CDC delay cell for the DRVCO was proposed to reduce the SET sensitivity in [12].…”

Section: Introductionmentioning

confidence: 99%