Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser

The Investigation on Single Event Function Failure for DC/DC Converters with Three Single Terminal Topological Structures

“…Total iron dose radiation will cause the electrical performance degradation of converters [2] . Single event transient (SET) may disturb the response of the feedback control circuitry [2] and PWM circuits [3] . The Single event burnout (SEB) and the single event gate rupture of the power MOSFETs could cause the failure of whole supply module [4,5] .…”