Single event transient mitigation through pulse quenching: Effectiveness at circuit level

Abstract

This paper exploits the pulse quenching effect in order to reduce circuit error rates due to single event transients in combinational logic. Although the effect allows for substantial reduction in the sensitive area of a single cell, logical masking at circuit level has to be also considered. Our results show that pulse quenching has a limited effectiveness at circuit level. The results of the proposed approach can be used to drive a reliability-aware design flow.