Abstract:This paper proposes novel single event upset (SEU) failure probability evaluation and periodic scrubbing techniques for hierarchical parallel vision processors. To automatically evaluate the SEU failure probability and identify all the critical elements in a processor, complementary fault injection methods based on logic circuit simulator and Perl script are proposed. These methods can be used to randomly inject faults into D flip-flops (DFFs) and various types of memory at the register transfer level (RTL) as… Show more
Set email alert for when this publication receives citations?
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.