Single event upset studies with the optical links of the ATLAS semiconductor tracker

Dowell, J. D.; Homer, R. J.; Mahout, G.; Jovanović, P.; Gregor, I. M.; Wastie, R.; Weidberg, A. R.; Troska, J.; White, David J.

doi:10.1016/s0168-9002(01)01411-5

Cited by 10 publications

(18 citation statements)

References 12 publications

(30 reference statements)

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“…As shown in Figure 2, the SEU rate decreases rapidly with the increasing amplitude of the input light signal. Such characteristic behavior was also reported by previous SEU investigations [1], [3], [4]. From a practical standpoint, this observation provides a way to mitigate the SEU effects by boosting the amplitude of the input light signal to the PiN diode receiver.…”

Section: Singleeventupset Rate and Crosssectionsupporting

confidence: 84%

“…The results from ondetector components as well as a detailed description of the optolink architecture are presented in reference [1]. It is well known from earlier radiationinduced SingleEventUpset (SEU) studies [2] [4], that the optical PiNdiode receiver itself is the device most vulnerable to the instantaneous impact of radiation on transmitted signals due to its comparatively large SEU sensitive area. The PiN diode coupled transimpedance amplifier (TIA) is also reported to contribute to the occurrence of SEUs.…”

Section: Introductionmentioning

confidence: 99%

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Time resolved studies of Single Event Upset in optical data receiver for the ATLAS pixel detector

Ziolkowski¹

2010

Proceedings of 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors — PoS

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A multichannel optical transceiver (optoboard) housing a PiN array coupled to a BPM signal decoding ASIC, was exposed to a proton beam of 24 GeV/c momentum. The 40 MHz clock and 40 Mbit/s data supplied to the optoboard were restored directly on the board and then in addition transmitted back to the counting room for online checking of consistency. In the case of a data bit error or a missing clock transition, indicating an occurrence of a SEU, a sequence of time aligned data bits along with the corresponding clock states were recorded for offline analyses. A compact DAQ system based on a FPGA processor was customdeveloped for this task. Measurements were performed for input signals covering a certain range of optical power. We present results obtained from the August 2009 run at the CERN irradiation facility, including the SEU occurrence rate and crosssection, both as a function of the input optical amplitude, along with the timeresolved structure of the SEU incidents. 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor

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Section: Singleeventupset Rate and Crosssectionsupporting

confidence: 84%

Section: Introductionmentioning

confidence: 99%

Time resolved studies of Single Event Upset in optical data receiver for the ATLAS pixel detector

Ziolkowski¹

2010

Proceedings of 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors — PoS

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“…We also measured bit errors as a function of PIN current during spills to calculate the single event upset (SEU) cross section as shown in Figure 15. Comparing our results with the results from a similar study for the SCT [11], we find that the SEU for both systems are similar, suggesting that the dominant source of SEU effects is energy deposition in PIN diode. Using the estimated particle flux at the location of the opto-board on the pixel detector (2 x 10 6 s -1 cm -2 ) and SEU cross section, we calculate the bit error rate (BER) as a function of PIN current.…”

Section: Irradiation Studiessupporting

confidence: 77%

ATLAS pixel opto-electronics

Arms

Gan

Jackson

et al. 2005

Nuclear Instruments and Methods in Physics Research Section A:

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We have developed two radiation-hard ASICs for optical data transmission in the ATLAS pixel detector at the LHC at CERN: a driver chip for a Vertical Cavity Surface Emitting Laser (VCSEL) diode for 80 Mbit/s data transmission from the detector, and a Bi-Phase Mark decoder chip to recover the control data and 40 MHz clock received optically by a PIN diode. We have successfully implemented both ASICs in 0.25 µm CMOS technology using enclosed layout transistors and guard rings for increased radiation hardness. We present results of the performance of these chips, including irradiation with 24 GeV protons up to 61 Mrad (2.3 x 10 15 p/cm 2 ).

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“…Fig. 9 shows 300-465 MeV/c pion and proton data taken at the Paul Scherrer Institut [10]. In this plot, the SEU cross-section versus is shown, where is defined as the ratio of the bit error rate (BER) and the particle flux and is the minimum energy deposited in the PIN photodiode.…”

Section: Single Event Upsetsmentioning

confidence: 99%

Radiation-tolerant optical links for the ATLAS inner detector

Gregor

2002

IEEE Trans. Nucl. Sci.

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ATLAS is one of the large particle detectors at the Large Hadron Collider, which will become operational in 2006. The data from the ATLAS semiconductor tracker and pixel detector to the acquisition electronics will be transferred via radiation-tolerant optical links. The overall architecture and the performance of these optical data links are described. A major focus is the radiation tolerance of the single components and the behavior of the optical links in an ATLAS-like environment.Index Terms-ATLAS, irradiation damage, Large Hadron Collider (LHC), PIN photodiodes, single event upsets, vertical cavity surface-emitting laser (VCSEL).

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Single event upset studies with the optical links of the ATLAS semiconductor tracker

Cited by 10 publications

References 12 publications

Time resolved studies of Single Event Upset in optical data receiver for the ATLAS pixel detector

Time resolved studies of Single Event Upset in optical data receiver for the ATLAS pixel detector

ATLAS pixel opto-electronics

Radiation-tolerant optical links for the ATLAS inner detector

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