Single Hit Energy-resolved Laue Diffraction

Patel, Suketu; Suggit, Matthew; Stubley, P. G.; Hawreliak, J.; Ciricosta, O.; Comley, A. J.; Collins, G. W.; Eggert, J. H.; Foster, J. M.; Wark, J. S.; Higginbotham, Andrew

doi:10.1063/1.4921774

Cited by 3 publications

(4 citation statements)

References 29 publications

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“…When input to the nonlinear elastic relation, this compression yields a longitudinal stress of 9 ± 2 GPa, indicating that the sample is modulated back toward the expected HEL after E2. This dual elastic plateau of E1 and E2 is the first direct imaging of features predicted by recent elasticity and molecular dynamics simulations of laser-driven shocked silicon, and the elastic macroscopic compressions predicted by simulation and observed in previous Laue diffraction measurements match well with the compressions reported in this study (19,(21)(22)(23).…”

Section: Discussionsupporting

confidence: 88%

“…Molecular dynamics and plasticity simulations predict an inelastic phase transition, but it is only within the past year that experiments have resolved the high-pressure crystalline structures necessary to refine computational models ( 19 , 20 ). In addition, recent Laue diffraction experiments showed an anomalous elastic response with two distinct compression regions, but as the response was not spatially resolved, the geometry and mechanism of the two elastic regions remained elusive ( 21 , 22 ). Simulations suggest that the material may exhibit a dual-elastic plateau following the primary elastic wave along the shock direction ( 23 ).…”

Section: Introductionmentioning

confidence: 99%

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Direct imaging of ultrafast lattice dynamics

et al. 2019

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Under rapid high-temperature, high-pressure loading, lattices exhibit complex elastic-inelastic responses. The dynamics of these responses are challenging to measure experimentally because of high sample density and extremely small relevant spatial and temporal scales. Here, we use an x-ray free-electron laser providing simultaneous in situ direct imaging and x-ray diffraction to spatially resolve lattice dynamics of silicon under high–strain rate conditions. We present the first imaging of a new intermediate elastic feature modulating compression along the axis of applied stress, and we identify the structure, compression, and density behind each observed wave. The ultrafast probe x-rays enabled time-resolved characterization of the intermediate elastic feature, which is leveraged to constrain kinetic inhibition of the phase transformation between 2 and 4 ns. These results not only address long-standing questions about the response of silicon under extreme environments but also demonstrate the potential for ultrafast direct measurements to illuminate new lattice dynamics.

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Section: Discussionsupporting

confidence: 88%

Section: Introductionmentioning

confidence: 99%

Direct imaging of ultrafast lattice dynamics

et al. 2019

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“…As was noted for the SHiELD technique [22], noise-for example, arising from fluorescence-could be eliminated to a large extent since it will occur at pixel positions which are uncorrelated with the photon energy and the expected position of the Debye-Scherrer rings.…”

Section: Discussionmentioning

confidence: 99%

“…We note that our proposed method, which we call X-ray Characterization by Energy-Resolved Powder (XCERP) diffraction, is similar to Single Hit Energy-resolved Laue Diffraction (SHiELD). In the latter method energy-resolved photon counting of Laue diffraction from a single crystal is used to determine changes in the crystal structure when under dynamic stress [22]. With XCERP diffraction this concept is inverted so that diffraction from a known crystal structure is used to determine properties of the unknown incident x-ray beam.…”

Section: Introductionmentioning

confidence: 99%

X-ray characterization by energy-resolved powder diffraction

Cheung

Hooker

2016

Phys. Rev. Accel. Beams

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A method for single-shot, nondestructive characterization of broadband x-ray beams, based on energyresolved powder diffraction, is described. Monte-Carlo simulations are used to simulate data for x-ray beams in the keV range with parameters similar to those generated by betatron oscillations in a laser-driven plasma accelerator. The retrieved x-ray spectra are found to be in excellent agreement with those of the input beams for realistic numbers of incident photons. It is demonstrated that the angular divergence of the x rays can be deduced from the deviation of the detected photons from the Debye-Scherrer rings which would be produced by a parallel beam. It is shown that the angular divergence can be measured as a function of the photon energy, yielding the angularly resolved spectrum of the input x-ray beam.

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Single-shot structural analysis by high-energy X-ray diffraction using an ultrashort all-optical source

Rakowski

Golovin

O’Neal

et al. 2017

Sci Rep

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High-energy X-rays (HEX-rays) with photon energies on order of 100 keV have attractive characteristics, such as comparably low absorption, high spatial resolution and the ability to access inner-shell states of heavy atoms. These properties are advantageous for many applications ranging from studies of bulk materials to the investigation of materials in extreme conditions. Ultrafast X-ray diffraction allows the direct imaging of atomic dynamics simultaneously on its natural time and length scale. However, using HEX-rays for ultrafast studies has been limited due to the lack of sources that can generate pulses of sufficiently short (femtosecond) duration in this wavelength range. Here we show single-crystal diffraction using ultrashort ~90 keV HEX-ray pulses generated by an all-optical source based on inverse Compton scattering. We also demonstrate a method for measuring the crystal lattice spacing in a single shot that contains only ~105 photons in a spectral bandwidth of ~50% full width at half maximum (FWHM). Our approach allows us to obtain structural information from the full X-ray spectrum. As target we use a cylindrically bent Ge crystal in Laue transmission geometry. This experiment constitutes a first step towards measurements of ultrafast atomic dynamics using femtosecond HEX-ray pulses.

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Single Hit Energy-resolved Laue Diffraction

Cited by 3 publications

References 29 publications

Direct imaging of ultrafast lattice dynamics

Direct imaging of ultrafast lattice dynamics

X-ray characterization by energy-resolved powder diffraction

Single-shot structural analysis by high-energy X-ray diffraction using an ultrashort all-optical source

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