2015
DOI: 10.1002/qre.1892
|View full text |Cite
|
Sign up to set email alerts
|

Single Mixed Sampling Plan Based on Yield Index for Linear Profiles

Abstract: Acceptance sampling plans have been widely used to decide whether an inspection lot from a supplier should be accepted or rejected. According to an economical point of view, a mixed sampling plan is better than the sampling plan by attributes. In some situations, lot sentencing can be determined by sampling plans by attributes and by variables simultaneously on the same product. In this paper, we propose a single mixed acceptance sampling plan based on the yield index for linear profiles for lot sentencing. Th… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
7
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
6

Relationship

3
3

Authors

Journals

citations
Cited by 6 publications
(7 citation statements)
references
References 20 publications
0
7
0
Order By: Relevance
“…This problem was solved in Klufa (2008), the exact solution is in Kaspříková (2012) -LTPDvar is an add-on package to the R software (see R Development Core Team 2011). Similar problems are solved in Chen and Chou (2001), Kaspříková and Klufa (2015), Wilrich (2012), Ho et al (2012), Yen et al (2014), Klufa (2015), Aslam et al (2015), Wang and Lo (2015), Balamurali et al (2014).…”
mentioning
confidence: 68%
“…This problem was solved in Klufa (2008), the exact solution is in Kaspříková (2012) -LTPDvar is an add-on package to the R software (see R Development Core Team 2011). Similar problems are solved in Chen and Chou (2001), Kaspříková and Klufa (2015), Wilrich (2012), Ho et al (2012), Yen et al (2014), Klufa (2015), Aslam et al (2015), Wang and Lo (2015), Balamurali et al (2014).…”
mentioning
confidence: 68%
“…The choice of the optimal EWMA parameter is based on minimizing the sum of squares error from previous lots; that is, SSE=t=2TtrueC^puAEWMAttrueC^puA2. We adopted the R code developed by Wang to determine the value of λ () Step 4Make a decision: accept the lot if Ctrue^puAEWMAtc, where c is critical value; otherwise reject it. Using Equation , the OC function of our proposed plan is derived as Pa()C=P()Ctrue^puAEWMAtc=1normalΦ()()cCAQLλ2λ2+9G2[]ϕ()3G218m2n[]ϕ()3CAQL2, where C = C puA .…”
Section: Proposed Single Sampling Planmentioning
confidence: 99%
“…Aslam et al presented the EWMA statistic with a process mean for an acceptance sampling plan. Recently, Wang implemented the EWMA model with the yield index S pkA for linear profiles with two‐sided specifications. However, the asymptotic distributions of S pkA and C pkA are totally different.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Subsequently, the ASN of the dependent plan will be lower. Wang and Lo developed a single mixed sampling plan based on the yield index for linear profiles. Based on our knowledge, there is no work on dependent mixed sampling plans and the mixed repetitive sampling plan based on the yield index for linear profiles.…”
Section: Introductionmentioning
confidence: 99%