2017
DOI: 10.1107/s1600576717005581
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Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector

Abstract: The full strain and stress tensor determination in a triaxially stressed single crystal using X-ray diffraction requires a series of lattice spacing measurements at different crystal orientations. This can be achieved using a tunable X-ray source. This article reports on a novel experimental procedure for single-shot full strain tensor determination using polychromatic synchrotron radiation with an energy range from 5 to 23 keV. Microbeam X-ray Laue diffraction patterns were collected from a copper micro-bendi… Show more

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Cited by 16 publications
(10 citation statements)
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“…13 This limits the application of most such methods to simple in-plane geometries or sections or special materials such as collagen fibrils with an ordered periodic structure at the nanoscale, while in most real-life systems, the 3D morphology may have no particular symmetry or alignment to sample shape. While recent innovative methods like 3D small-angle X-ray scattering (SAXS) tomography 14 and polychromatic X-ray diffraction, 15,16 which reconstruct 3D reciprocal space intensity in a model-free manner, circumvent this 2D limitation, these methods have limitations for in situ studies. SAXS tomography can take several hours of synchrotron time per reconstruction, 14 and the polychromatic X-ray diffraction analysis requires several minutes with a specialized energy-dispersive detector, 15 or scanning the photon energy.…”
Section: Introductionmentioning
confidence: 99%
“…13 This limits the application of most such methods to simple in-plane geometries or sections or special materials such as collagen fibrils with an ordered periodic structure at the nanoscale, while in most real-life systems, the 3D morphology may have no particular symmetry or alignment to sample shape. While recent innovative methods like 3D small-angle X-ray scattering (SAXS) tomography 14 and polychromatic X-ray diffraction, 15,16 which reconstruct 3D reciprocal space intensity in a model-free manner, circumvent this 2D limitation, these methods have limitations for in situ studies. SAXS tomography can take several hours of synchrotron time per reconstruction, 14 and the polychromatic X-ray diffraction analysis requires several minutes with a specialized energy-dispersive detector, 15 or scanning the photon energy.…”
Section: Introductionmentioning
confidence: 99%
“…In the present work, all measured (hkl) belong to the same zone in reciprocal space. As demonstrated by Abboud et al (2017), the measurement of reflections belonging to different crystallographic zones provides access to all components of the strain tensor with rather high accuracy. Therefore the technique may serve as an effective tool to evaluate strain variations of nano-objects as a function of different kinds of deformation.…”
Section: Discussionmentioning
confidence: 99%
“…Accuracies close to 10 À4 were obtained on Áa=a in Ge single-and UO 2 polycrystals (Robach et al, 2013) and a full strain analysis was performed in stressed Ge microstructures (Tardif et al, 2016). Measurements with a two-dimensional energy dispersive X-ray CCD detector in a strained copper single crystal have demonstrated the advantages of single-shot acquisitions for determining the components of the full strain tensor (Abboud et al, 2017). The energy resolution of the pn-junction CCD is of the order of several hundred electronvolts depending on the Laue spot energy (130 eV at 5 keV) and yields strain accuracies close to 10 À3 .…”
Section: Introductionmentioning
confidence: 88%