Single-sided capacitive imaging for NDT

Diamond, G. G.; Hutchins, David A.; Gan, Tat-Hean; Purnell, Phil; Leong, Kennith Kin

doi:10.1784/insi.2006.48.12.724

Cited by 40 publications

(28 citation statements)

References 12 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…In traditional pipeline flow imaging access is missing from two sides. There has also been growing interest in planar array ECT for several new application areas in past few years [11][12][13][14][15][16]19]. Limited access tomography is of great importance when there is limited access to the materials under testing, consequently, the number of measurements can be collected from materials under testing is comparatively smaller than full access.…”

Section: Introductionmentioning

confidence: 99%

Resolution analysis using fully 3D electrical capacitive tomography

Wei

Soleimani

2015

Measurement

View full text Add to dashboard Cite

Please cite this article as: Z. Ye, H. Wei, M. Soleimani, Resolution Analysis Using Fully 3D Electrical Capacitive Tomography, Measurement (2014), doi: http://dx.Abstract-Electrical capacitance tomography (ECT) is a non-invasive imaging technique capable of imaging dielectric permittivity contrast of an object. The ECT image reconstruction uses measured capacitance data between pairs of electrode surrounding the object. In some practical ECT applications full access to the surrounding of the object may not be available. In most popular application in ECT for imaging industrial flow through a pipe, there will be missing data from two sides in direction of flow. Another example is a planar array ECT than can have access only to one side of the sample under test. In this paper, a fully 3D array ECT system is developed on six sides of a cubic geometry providing a full access to the imaging region. This fully 3D sensor is used to analyse image quality degradation as a result of missing sides. The sensor development, practical implication, comparison of results with different level of missing data is presented. The resolution analysis is proposed based on theoretical analysis of resolution matrix as well as using singular value decomposition of the Jacobian matrix. The paper presents a number of tools to analyse and quantify the image quality and information that can be achieved in image reconstruction process. The quality of the reconstructed images from experimental data is compared using image resolution parameter for various level of missing data and the results clearly showed how image quality drops with missing information.

show abstract

Section: Introductionmentioning

confidence: 99%

Resolution analysis using fully 3D electrical capacitive tomography

Wei

Soleimani

2015

Measurement

View full text Add to dashboard Cite

show abstract

“…The works [16,17] consider the method of non-destructive testing that is capable of visualizing defects in a wide range of materials and structures, ranging from insulators to metal conductors. This method, with further modification, can be used to visualize defects in NMPCM.…”

Section: Simulation Of Nanomodified Polymers Testing By the Electric mentioning

confidence: 99%

Simulation of nanomodified polymers testing by the electric capacitive method

Bazhenov

Protasov

Ivitskiy

et al. 2017

EEJET

View full text Add to dashboard Cite

“…Articles [18,19] address the method of nondestructive control, which is capable of performing the visualization of a wide range of materials and structures, starting from insulators to metal conductors. This method, if further developed, may help to extend the scope of applying intelligent sensors in PCM.…”

Section: Introductionmentioning

confidence: 99%