Single Step 2-Port Device De-Embedding Algorithm for Fixture-DUT-Fixture Network Assembly

Scafati, Simone; Pellegrino, Enza; Paulis, Francesco de; Olivieri, Carlo; Drewniak, James L.; Orlandi, Antonio

doi:10.3390/electronics10111275

Cited by 2 publications

(3 citation statements)

References 13 publications

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“…The present contribution extends the analytical approach presented in reference 18 to the case of the complete de‐embedding of the left fixture (FL) and right fixture (FR) (whose S ‐parameters are known in advance) from the S ‐parameter measurement of a 2‐port FL‐DUT‐FR assembly, avoiding any transformation of S ‐ and T ‐parameters. The single‐step approach for the generalized multiport S‐parameter cascade in reference 21 cannot be applied and inverted for the case of a port number greater than 2.…”

Section: Introductionmentioning

confidence: 94%

“…The de‐embedding overcomes the need of the TRL calibration procedure 13 where several test structures are analytically examined confirming the applicability of the methodology; however, the limitation of the approach to deal with multiport (ports number >2) devices is highlighted. The work in reference 18 is a precursor of the technique proposed in this article. The method described in reference 18 for the 2‐port case de‐embeds both left and right fixtures at once.…”

Section: Introductionmentioning

confidence: 99%

“…The work in reference 18 is a precursor of the technique proposed in this article. The method described in reference 18 for the 2‐port case de‐embeds both left and right fixtures at once. It proposes a method based on the newly developed multinetwork cascading algorithm.…”

Section: Introductionmentioning

confidence: 99%

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Generalized analytical formulation for de‐embedding of multiport devices based on known fixtures

Scafati

Paulis

Olivieri

et al. 2022

Int J RF Mic Comp-Aid Eng

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The de-embedding is a technique used in radio frequency and signal integrity measurements to extract the scattering (S)-parameters of the device under test (DUT) from the measured data of a global assembly and based on known S-parameters of the left and right test fixtures; thus, it removes the impact of the text fixtures used for the connection of the DUT to the instrumentation. Once the S-parameters are measured, the de-embedding is performed by a multistep approach involving the bidirectional transformation of the S-parameters into the corresponding transfer scattering (T)-parameters. The latter approach is well established for two-and four-port networks and has been recently expanded to the multiport case. This work proposes an alternative analytical formulation to de-embed a multiport device, knowing in advance only the S-parameters of the global multiport assembly and those of the test fixtures. The proposed method does not involve the S-to-T conversion and it requires only the algebraic manipulation of the S-parameter matrix elements; its practical implementation is very well fitted especially for multiport cases, and it is very fast in calculating the de-embedded DUT S-parameters for large port numbers. The results of the proposed formulation, applied to the case of a multipin high-speed connector, are compared with those obtained by measurement and simulations.Their accuracy is shown and discussed to demonstrate the validity of the proposed approach.

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Section: Introductionmentioning

confidence: 94%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Generalized analytical formulation for de‐embedding of multiport devices based on known fixtures

Scafati

Paulis

Olivieri

et al. 2022

Int J RF Mic Comp-Aid Eng

Self Cite

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show abstract

Single‐step algorithm for the cascade assembly of multiple S‐parameters based multiports networks

Paulis

Scafati

Olivieri

et al. 2022

Int J RF Mic Comp-Aid Eng

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The complexity of electronic systems for RF and digital applications is ever increasing, and the corresponding compliance analysis for ensuring the required specifications in terms of performances, signal and power integrity is a challenging task often accomplished by relying on commercial circuit simulators. The modeling of multiport devices involves the assembly of electrical networks usually described in terms of S-parameter. This work proposes a new single-step algorithm that computes the global S-parameter matrix for a cascade of multiple networks with multiple ports without the need of any S-parameter transformation in T-parameters and their inverse transformation. The proposed method involves the construction of a large matrix filled with all S-parameters of all networks, and the subsequent evaluation of only one matrix expression. The proposed method is shown to be very efficient and reliable, since it can be easily automated without the need of a manual connections of tens or even hundreds of ports of the multiple blocks, which is an action that needs to be performed within a typical circuit simulator environment. Also, the proposed method overcomes the limitation of the standard method based on S-to-T parameter transformation since it is of general applicability to networks with different number of input and output ports. Examples involving the cascade of multiple 2-ports and multiports networks are considered, and the results are validated and compared with the reference results obtained from a commercial circuit simulator. The proposed method is shown to be effective and fast compared to its counterpart based on the T-parameters.

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Single Step 2-Port Device De-Embedding Algorithm for Fixture-DUT-Fixture Network Assembly

Cited by 2 publications

References 13 publications

Generalized analytical formulation for de‐embedding of multiport devices based on known fixtures

Generalized analytical formulation for de‐embedding of multiport devices based on known fixtures

Single‐step algorithm for the cascade assembly of multiple S‐parameters based multiports networks

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