SiPM-matrix readout of two-phase argon detectors using electroluminescence in the visible and near infrared range

Aalseth, C. E.; Abdelhakim, S.; Agnes, P.; Ajaj, R.; Albuquerque, I. F. M.; Alexander, T.; Alici, A.; Alton, A. K.; Amaudruz, P.; Ameli, F.; Anstey, J.; Antonioli, P.; Arba, M.; Arcelli, S.; Ardito, R.; Arnquist, I. J.; Arpaia, P.; Asner, D. M.; Asunskis, A.; Ave, M.; Back, H. O.; Barbaryan, V.; Olmedo, A. Barrado; Batignani, G.; Bisogni, M. G.; Bocci, V.; Bondar, A.; Bonfini, G.; Bonivento, W.; Borisova, E.; Bottino, B.; Boulay, M. G.; Bunker, R.; Bussino, S.; Buzulutskov, A.; Cadeddu, M.; Cadoni, M.; Caminata, A.; Canci, N.; Candela, A.; Cantini, C.; Caravati, M.; Cariello, M.; Carnesecchi, F.; Castellani, A.; Castello, P.; Cavalcante, P.; Cavazza, D.; Cavuoti, S.; Cebrian, S.; Ruiz, J. M. Cela; Celano, B.; Cereseto, R.; Chashin, S.; Cheng, W.; Chepurnov, A.; Cicalò, C.; Cifarelli, L.; Citterio, M.; Coccetti, F.; Cocco, V.; Colocci, M.; Vilda, E. Conde; Consiglio, L.; Cossio, F.; Covone, G.; Crivelli, P.; D'Antone, I.; D'Incecco, M.; Rolo, M. D. Da Rocha; Dadoun, O.; Daniel, M.; Davini, S.; De Cecco, S.; De Deo, M.; De Falco, A.; De Gruttola, D.; De Guido, G.; De Rosa, G.; Dellacasa, G.; Demontis, P.; De Pasquale, S.; Derbin, A. V.; Devoto, A.; Di Eusanio, F.; Di Noto, L.; Di Pietro, G.; Di Stefano, P.; Dionisi, C.; Dolganov, G.; Dordei, F.; Downing, M.; Edalatfar, F.; Empl, A.; Diaz, M. Fernandez; Filip, C.; Fiorillo, G.; Fomenko, K.; Franceschi, A.; Franco, D.; Frolov, E.; Froudakis, G. E.; Funicello, N.; Gabriele, F.; Gabrieli, A.; Galbiati, C.; Garbini, M.; Abia, P. Garcia; Fora, D. Gascón; Gendotti, A.; Ghiano, C.; Ghisi, A.; Giampa, P.; Giampaolo, R. A.; Giganti, C.; Giorgi, M. A.; Giovanetti, G. K.; Gligan, M. L.; Gorchakov, O.; Grab, M.; Diaz, R. Graciani; Grassi, M.; Grate, J. W.; Grobov, A.; Gromov, M.; Guan, M.; Guerra, M. B. B.; Guerzoni, M.; Gulino, M.; Haaland, R. K.; Hackett, B. R.; Hallin, A.; Haranczyk, M.; Harrop, B.; Hoppe, E. W.; Horikawa, S.; Hosseini, B.; Hubaut, F.; Humble, P.; Hungerford, E. V.; Ianni, An.; Ilyasov, A.; Ippolito, V.; Jillings, C.; Keeter, K.; Kendziora, C. L.; Kochanek, I.; Kondo, K.; Kopp, G.; Korablev, D.; Korga, G.; Kubankin, A.; Kugathasan, R.; Kuss, M.; La Commara, M.; La Delfa, L.; Lai, M.; Lebois, M.; Lehnert, B.; Levashko, N.; Li, X.; Liqiang, Q.; Lissia, M.; Lodi, G. U.; Longo, G.; Lussana, R.; Luzzi, L.; Machado, A. A.; Machulin, I. N.; Mandarano, A.; Manecki, S.; Mapelli, L.; Margotti, A.; Mari, S. M.; Mariani, M.; Maricic, J.; Marinelli, M.; Marras, D.; Martínez, M.; Rojas, A. D. Martinez; Mascia, M.; Mason, J.; Masoni, A.; McDonald, A. B.; Messina, A.; Miletic, T.; Milincic, R.; Moggi, A.; Moioli, S.; Monroe, J.; Morrocchi, M.; Mroz, T.; Mu, W.; Muratova, V. N.; Murphy, S.; Muscas, C.; Musico, P.; Nania, R.; Napolitano, T.; Agasson, A. Navrer; Nessi, M.; Nikulin, I.; Nosov, V.; Nowak, J. A.; Oleinik, A.; Oleynikov, V.; Orsini, M.; Ortica, F.; Pagani, L.; Pallavicini, M.; Palmas, S.; Pandola, L.; Pantic, E.; Paoloni, E.; Pazzona, F.; Peeters, S.; Pegoraro, P. A.; Pelczar, K.; Pellegrini, L. A.; Pellegrino, C.; Pelliccia, N.; Perotti, F.; Pesudo, V.; Picciau, E.; Pietropaolo, F.; Pocar, A.; Pollmann, T. R.; Portaluppi, D.; Poudel, S. S.; Pralavorio, P.; Price, D.; Radics, B.; Raffaelli, F.; Ragusa, F.; Razeti, M.; Regenfus, C.; Renshaw, A. L.; Rescia, S.; Rescigno, M.; Retiere, F.; Rignanese, L. P.; Ripoli, C.; Rivetti, A.; Rode, J.; Romani, A.; Romero, L.; Rossi, N.; Rubbia, A.; Sala, P.; Salatino, P.; Samoylov, O.; García, E. Sánchez; Sandford, E.; Sanfilippo, S.; Sant, M.; Santone, D.; Santorelli, R.; Savarese, C.; Scapparone, E.; Schlitzer, B.; Scioli, G.; Segreto, E.; Seifert, A.; Semenov, D. A.; Shchagin, A.; Sheshukov, A.; Siddhanta, S.; Simeone, M.; Singh, P. N.; Skensved, P.; Skorokhvatov, M. D.; Smirnov, O.; Sobrero, G.; Sokolov, A.; Sotnikov, A.; Stainforth, R.; Steri, A.; Stracka, S.; Strickland, V.; Suffritti, G. B.; Sulis, S.; Suvorov, Y.; Szelc, A. M.; Tartaglia, R.; Testera, G.; Thorpe, T.; Tonazzo, A.; Tosi, A.; Tuveri, M.; Unzhakov, E. V.; Usai, G.; Vacca, A.; Vázquez-Jáuregui, E.; Viant, T.; Viel, S.; Villa, F.; Vishneva, A.; Vogelaar, R. B.; Wahl, J.; Walding, J. J.; Wang, H.; Wang, Y.; Westerdale, S.; Wheadon, R. J.; Williams, R.; Wilson, J.; Wojcik, Ma. M.; Wojcik, Ma.; Wu, S.; Xiao, X.; Yang, C.; Ye, Z.; Zuffa, M.; Zuzel, G.

doi:10.48550/arxiv.2004.02024

Cited by 1 publication

(7 citation statements)

References 39 publications

(75 reference statements)

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“…Photon emission spectra in gaseous Ar due to ordinary scintillations in the VUV measured in [8], NBrS EL at 8.3 Td theoretically calculated in [9] and avalanche scintillations in the NIR measured in [10,11]. Also shown are the Photon Detection Efficiency (PDE) of SiPM (MPPC 13360-6050PE (Hamamatsu)) at overvoltage of 5.6 V and the transmittance of the acrylic plate (1.5 mm thick) [12].…”

Section: Electroluminescence Due To Excimer Emissionmentioning

confidence: 99%

“…This may lead to more stable operation due to avoiding the problems of WLS degradation and its dissolving in liquid [26], as well as that of WLS peeling off from the substrate. Such a concept was realized in [12]. It might be considered as backup solutions for large-scale two-phase Ar detectors, in case the problem of WLS instability cannot be resolved.…”

Section: Concepts Of Light Signal Amplificationmentioning

confidence: 99%

“…In addition to the performance as charge multiplier, THGEM can be used as an interface grid immersed in the liquid (see Figure 1), acting as an effective electron transmission electrode defining the electron emission and EL regions of the two-phase detector [79]. Examples of such THGEM electrodes used in practice [9,12] are shown in Figure 21, left. The feature of such THGEM interface grid is that one has to apply a high enough voltage across it, to have the 100% electron transmittance.…”

Section: Thgem As Interface Grid In Two-phase Detectorsmentioning

confidence: 99%

“…Left: microscope images of two THGEM electrodes used as interface grid in two-phase Ar detectors in [9,12]: with 28% and 75% optical transparency [79]. Right: Calculated electron transmission through 28% THGEM acting as an interface grid immersed in liquid Ar as a function of the voltage across THGEM (bottom axis) and nominal electric field in THGEM (top axis) [79].…”

Section: Figure 21mentioning

confidence: 99%

“…Figure 22. Concept of combined charge/light signal amplification in two-phase detector with EL gap, using avalanche scintillations and combined THGEM/SiPM-matrix multiplier [12].…”

Section: Two-phase Ar Detector With Combined Thgem/sipm-matrix Multip...mentioning

confidence: 99%

See 4 more Smart Citations

Electroluminescence and Electron Avalanching in Two-Phase Detectors

Buzulutskov

2020

Instruments

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Electroluminescence and electron avalanching are the physical effects used in two-phase argon and xenon detectors for dark matter searches and neutrino detection, to amplify the primary ionization signal directly in cryogenic noble-gas media. We review the concepts of such light and charge signal amplification, including a combination thereof, both in the gas and in the liquid phase. Puzzling aspects of the physics of electroluminescence and electron avalanching in two-phase detectors are explained, and detection techniques based on these effects are described.

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Section: Electroluminescence Due To Excimer Emissionmentioning

confidence: 99%

Section: Concepts Of Light Signal Amplificationmentioning

confidence: 99%

Section: Thgem As Interface Grid In Two-phase Detectorsmentioning

confidence: 99%

Section: Figure 21mentioning

confidence: 99%

“…Figure 22. Concept of combined charge/light signal amplification in two-phase detector with EL gap, using avalanche scintillations and combined THGEM/SiPM-matrix multiplier [12].…”

Section: Two-phase Ar Detector With Combined Thgem/sipm-matrix Multip...mentioning

confidence: 99%

See 3 more Smart Citations

Electroluminescence and Electron Avalanching in Two-Phase Detectors

Buzulutskov

2020

Instruments

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show abstract

SiPM-matrix readout of two-phase argon detectors using electroluminescence in the visible and near infrared range

Cited by 1 publication

References 39 publications

Electroluminescence and Electron Avalanching in Two-Phase Detectors

Electroluminescence and Electron Avalanching in Two-Phase Detectors

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