Size and shape of crystallites and internal stresses in carbon blacks

Ungár, Tamás; Gubicza, Jenő; Tichy, G.; Pantea, Cristian; Żerda, T. W.

doi:10.1016/j.compositesa.2004.10.017

Cited by 62 publications

(30 citation statements)

References 18 publications

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“…In spite of that the modified Williamson-Hall plot can provide extremely valuable information about the qualitative nature of line broadening, cf. [34,75,76,81,82]. The modified Warren-Averbach method [68,77], on the other hand is physically exact, with the only constraint that it works with the smaller values of the Fourier variable.…”

Section: Modified Williamson-hall Plot and Modified Warren-averbach Mmentioning

confidence: 99%

Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis

Gubicza

Ungár

2007

Zeitschrift Für Kristallographie - Crystalline Materials

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Abstract. X-ray line profile analysis is a powerful alternative tool for determining dislocation densities, dislocation type, crystallite and subgrain size and size-distributions, and planar defects, especially the frequency of twin boundaries and stacking faults. The method is especially useful in the case of submicron grain size or nanocrystalline materials, where X-ray line broadening is a well pronounced effect, and the observation of defects with very large density is often not easy by transmission electron microscopy. The fundamentals of X-ray line broadening are summarized in terms of the different qualitative breadth methods, and the more sophisticated and more quantitative whole pattern fitting procedures. The efficiency and practical use of X-ray line profile analysis is shown by discussing its applications to metallic, ceramic, diamond-like and polymer nanomaterials.

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Section: Modified Williamson-hall Plot and Modified Warren-averbach Mmentioning

confidence: 99%

Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis

Gubicza

Ungár

2007

Zeitschrift Für Kristallographie - Crystalline Materials

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“…Since, however, the presence of dislocations in carbon black has not yet been verified experimentally, the formal dislocation density has been converted to stresses prevailing between crystallites attached to each other by necking. The conversion has been carried out by using the Griffith model of stresses in strained cracks [119]. It is found that compression induces heterogeneous internal microstresses, whereas, heat treatment slightly decreases these stresses.…”

Section: Carbon and Diamondmentioning

confidence: 99%

“…The effect of graphitization and pressure treatment on the microstructure and internal stresses of carbon blacks is studied by XLPA [118,119]. The Fourier transforms of the experimental line profiles are fitted by theoretical functions based on the model of the microstructure.…”

Section: Carbon and Diamondmentioning

confidence: 99%

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Nanocrystalline materials studied by powder diffraction line profile analysis

Ungár¹,

Gubicza²

2007

Zeitschrift Für Kristallographie - Crystalline Materials

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Abstract. X-ray powder diffraction is a powerful tool for characterising the microstructure of crystalline materials in terms of size and strain. It is widely applied for nanocrystalline materials, especially since other methods, in particular electron microscopy is, on the one hand tedious and time consuming, on the other hand, due to the often metastable states of nanomaterials it might change their microstructures. It is attempted to overview the applications of microstructure characterization by powder diffraction on nanocrystalline metals, alloys, ceramics and carbon base materials. Whenever opportunity is given, the data provided by the X-ray method are compared and discussed together with results of electron microscopy. Since the topic is vast we do not try to cover the entire field.

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“…The most energetic sites, which very effectively adsorb polymers, are usually identified as crystallite edges. Small crystallites are not energetically favorable structure [33]. So as the crystallite size decreases the rubber filler interaction decreases this happens in favor to the filler-filler interaction rather than rubber-filler interaction.…”

Section: Xrdmentioning

confidence: 99%

Structure aggregation of carbon black in ethylene-propylene diene polymer

Lawandy¹,

Halim²,

Darwish³

2009

Express Polym. Lett.

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Abstract. The modulus of filled and unfilled Ethylene-propylene diene rubber (EPDM) vulcanizates was used to predict the shape-factor of carbon black aggregation in the polymer. Four types of carbon black that vary in particle size and structure were used in this study. Quadratic curves relating the carbon black volume concentration and the modulus ratio of filled and unfilled rubber vulcanizates were used to adopt the shape factor of certain carbon black type. The shape factor of MT, HAF, SRF and Lampblack were 3, 3.75, 4 and 4.25 respectively. X-ray diffraction technique (XRD) was also used to evaluate the relative size of crystallite on the filler surface to that of the rubber and correlating it to the shape factor of carbon black aggregation in the polymer. Effect of the pH values and structure of carbon blacks used on the shape factor of filler aggregates were also studied. It was found that the shape factor is independent on the particle size while it is dependent on the pH value and structure of carbon black. Also the crystallites size of the filler is proportional to the shape factor.

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Size and shape of crystallites and internal stresses in carbon blacks

Cited by 62 publications

References 18 publications

Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis

Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis

Nanocrystalline materials studied by powder diffraction line profile analysis

Structure aggregation of carbon black in ethylene-propylene diene polymer

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