2008
DOI: 10.1088/0953-8984/20/45/454216
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Size-controlled quantum dots fabricated by precipitation of epitaxially grown, immiscible semiconductor heterosystems

Abstract: Epitaxial quantum dots with symmetric and highly faceted shapes are fabricated by thermal annealing of two-dimensional (2D) PbTe epilayers embedded in a CdTe matrix. This novel self-organization scheme is based on the immiscibility of the involved semiconductor materials, which originates from the different bulk bonding configurations and the concomitant lattice-type mismatch. By varying the thickness of the initial 2D layers, the dot size can be controlled in a range between 5 and 25 nm, with areal densities … Show more

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Cited by 4 publications
(6 citation statements)
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“…After the MBE growth had been carried out in accordance with the technological protocol described above, both samples were annealed under the same conditions, namely, at 350 °C for 1 h. This annealing procedure resulted in the disintegration of ultrathin, continuous CdTe or PbTe layers into CdTe or PbTe nanoprecipitates. This suggests that the formation of CdTe antidots in a PbTe matrix proceeds in the same way as the formation of PbTe dots in a CdTe matrix and is driven by the minimization of the CdTe/PbTe interface energy and phase separation near thermodynamic equilibrium. , Therefore, one can expect a correlation between the initial thickness of the CdTe layers in the CdTe/PbTe multilayer and the size of the CdTe antidots, as was established for PbTe dots in CdTe matrix . To verify this idea, we prepared three samples, each containing 10 CdTe layers with thicknesses of 1, 2, and 4 nm, separated by PbTe layers with a thickness of 25 nm.…”
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confidence: 84%
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“…After the MBE growth had been carried out in accordance with the technological protocol described above, both samples were annealed under the same conditions, namely, at 350 °C for 1 h. This annealing procedure resulted in the disintegration of ultrathin, continuous CdTe or PbTe layers into CdTe or PbTe nanoprecipitates. This suggests that the formation of CdTe antidots in a PbTe matrix proceeds in the same way as the formation of PbTe dots in a CdTe matrix and is driven by the minimization of the CdTe/PbTe interface energy and phase separation near thermodynamic equilibrium. , Therefore, one can expect a correlation between the initial thickness of the CdTe layers in the CdTe/PbTe multilayer and the size of the CdTe antidots, as was established for PbTe dots in CdTe matrix . To verify this idea, we prepared three samples, each containing 10 CdTe layers with thicknesses of 1, 2, and 4 nm, separated by PbTe layers with a thickness of 25 nm.…”
mentioning
confidence: 84%
“…Moreover, we expect that, using this method (under better-adjusted technological conditions), it should be possible to obtain CdTe dots with diameters smaller than 4 nm. Note that the lower “theoretical” limit for CdTe layers with an initial thickness of just one monolayer (0.3 nm) is about 1–2 nm . Similarly to PbTe dots, ,, the CdTe antidots very often exhibit the same highly symmetric rhombicuboctahedral shape, as shown in Figure .…”
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confidence: 94%
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