2006
DOI: 10.1063/1.2338132
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Size dependence of optical properties and internal structure of plasma grown carbonaceous nanoparticles studied by in situ Rayleigh-Mie scattering ellipsometry

Abstract: We have analyzed the growth process of a-C:H nanoparticles in Ar–C2H2 and Ar–CH4 plasmas by means of in situ Rayleigh-Mie scattering ellipsometry. Complex refractive index (m=n−ki), mean particle radius (r), and particle size distribution (σ) of a-C:H nanoparticles are carefully determined and compared with those of a-C:H thin films deposited at similar conditions. It is found that, in both plasmas, small particles (r<25nm) have graphitelike properties whereas large particles have polymerlike characteri… Show more

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Cited by 59 publications
(52 citation statements)
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“…However, when the size of the particles exceeds this threshold of λ/10 then Rayleigh scattering is replaced by anisotropic Mie scattering where the scattered light is unequal in energy (inelastic scattering) to the incident light and angle-dependent ( Fig. 1) [30] where the scattered light is most intense towards the direction of the incident light [31]. This size threshold (λ/10) is due to the way electromagnetic waves (e.g., light) interact with a particle and falls beyond the scope of this review although excellent textbooks and reference literature are available for consultation [32,33].…”
Section: Scattering Of Light By Particlesmentioning
confidence: 99%
“…However, when the size of the particles exceeds this threshold of λ/10 then Rayleigh scattering is replaced by anisotropic Mie scattering where the scattered light is unequal in energy (inelastic scattering) to the incident light and angle-dependent ( Fig. 1) [30] where the scattered light is most intense towards the direction of the incident light [31]. This size threshold (λ/10) is due to the way electromagnetic waves (e.g., light) interact with a particle and falls beyond the scope of this review although excellent textbooks and reference literature are available for consultation [32,33].…”
Section: Scattering Of Light By Particlesmentioning
confidence: 99%
“…A comparable technique termed "Mie scattering ellipsometry" (MSE) is used in plasma physics [101,102]. Main focus in MSE applications has been the determination of particle size and size distribution for particles created in plasmas [103][104][105], e.g. for process control in dust sensitive micro device fabrication.…”
Section: Ellipsometric Light Scatteringmentioning
confidence: 99%
“…Another argument for an effectively constant value of S p can be based on measurements (Hong and Winter 2006) that show the refractive index function, f (m), decreases with increasing primary particle size. Real-time nanoparticle growth and scattering measurements for hydrocarbon particles in plasma demonstrate that the imaginary component of the complex refractive index decreases with increasing particle size.…”
Section: Size Uniformity Of Primary Particlesmentioning
confidence: 99%
“…The estimate for overall accuracy uncertainty of S p is based on compensating levels of uncertainty for d p (±12-15%) and f (m)/ρ p (±12-15%), as described by Hong and Winter, 2006. …”
Section: Total Accuracy and Precision Estimatesmentioning
confidence: 99%