Size-dependent photo-induced shift of the first exciton band in CdTe quantum dots in glass prepared by a two-stage heat-treatment process

Yükselici, M. H.; Allahverdi, Ç.

doi:10.1016/j.jlumin.2007.10.005

Cited by 14 publications

(3 citation statements)

References 24 publications

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“…CdTe thin films can be grown in several ways including (i) chemical bath deposition (CBD) ; (ii) a two‐stage heat‐treatment process ; (iii) spray pyrolysis ; (iv) thermal evaporation; (v) electrodeposition ; and (vi) sputtering . In the present work, we use a thermal evaporation method, as one of the techniques mentioned above to perform a material study, to investigate the size‐dependent optical and structural properties of CdTe films that might be used to produce thin‐film photovoltaic modules for different uses.…”

Section: Introductionmentioning

confidence: 99%

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Structural and optical properties of CdTe thin film: A detailed investigation using optical absorption, XRD, and Raman spectroscopies

Nassar

Yükselici

Bozkurt

2016

Physica Status Solidi (b)

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Physical vapor deposition (PVD) is used to grow CdTe thin films of different thicknesses on glass substrates. The characterization of the samples is then investigated optically and structurally. Three experimental techniques were used in this study; optical absorption (ABS), Raman, and X‐ray diffraction (XRD) spectroscopies. In optical ABS spectroscopy, the Urbach energy related to the width of long‐wavelength tail decreases from 827 to 585 meV as the thickness increases from 100 to 500 nm, respectively. The thickness‐dependent particle size was calculated using the value of the size‐dependent optical absorption edge energy. A shift of 710 meV in the ABS edge energy takes place as the thickness increases from 100 to 500 nm. Thickness‐dependent shifting and widening of XRD line is presumably due to the size effect and strain. Relative to the phonon frequency of bulk CdTe crystal, a thickness‐dependent blueshift was observed in Raman spectra for the Longitudinal Optical (LO) phonon frequency, while a redshift for the longitudinal acoustic (LA) and transverse optical (TO) phonon frequencies is observed. In the present work, the results of optical absorption, XRD, and Raman analyses are combined in order to study the effect of particle‐size evolution, thickness‐dependent strain, and structural disorder.

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Section: Introductionmentioning

confidence: 99%

“…Investigations about CdTe thin films are rare, especially using Raman spectroscopy. Some articles have studied the optical and structural characterization for CdTe using absorption and/or XRD spectroscopies but not Raman . Meanwhile, there are limited references that are related to Raman spectroscopy of CdTe .…”

Section: Introductionmentioning

confidence: 99%

Structural and optical properties of CdTe thin film: A detailed investigation using optical absorption, XRD, and Raman spectroscopies

Nassar

Yükselici

Bozkurt

2016

Physica Status Solidi (b)

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“…Semiconductor nanocrystals exhibit modified electronic and optical properties due to quantum confinement and the study of their physical properties and their influence on host matrix seems to be an attractive research profile [1][2][3][4]. However, fabrication of nanocrystals in crystalline matrices was less attracted, the reason was limitations encountered during materials handling and methods used for embedding.…”

Section: Introductionmentioning

confidence: 99%