2012
DOI: 10.1166/mex.2012.1059
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Size-Tunable Fabrication of Au Nanodot Arrays via Electrodeposition-Assisted Capillary Force Lithography

Abstract: In this paper, we present a facile means of generating size-controllable Au nanodot arrays employing the electrochemically synthesized nanorings of poly(3,4-ethylenedioxythiopene) (PEDOT) within the patterned hole array of polystyrene (PS) template. First, patterned PS array with a diameter of 350 nm is prepared by capillary force lithography. Then, by altering the EDOT monomer concentration, applied potential, or electrodeposition time, PEDOT nanorings with tunable wall thickness are grown inside the PS hole … Show more

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Cited by 2 publications
(1 citation statement)
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“…[20][21][22][23] The trend of device down scaling and complicated stack structure motivates the enhanced metrology tool needed for foundry manufacturing. [24][25][26][27][28][29][30] Optical scatterometry technique is attracting attention to characterize critical dimensions (CDs) and overlays in the next generation semiconductor technology, due to its rapid measurement speed, nondestructive measurement, and complete pattern profile information, such as the width, side wall angle (SWA), and height. The experimental scatterometry spectra are collected and compared with the theoretical spectra calculated by the rigorous coupled wave Copyright: American Scientific Publishers analysis (RCWA) algorithm to extract the geometric shape information.…”
Section: Introductionmentioning
confidence: 99%
“…[20][21][22][23] The trend of device down scaling and complicated stack structure motivates the enhanced metrology tool needed for foundry manufacturing. [24][25][26][27][28][29][30] Optical scatterometry technique is attracting attention to characterize critical dimensions (CDs) and overlays in the next generation semiconductor technology, due to its rapid measurement speed, nondestructive measurement, and complete pattern profile information, such as the width, side wall angle (SWA), and height. The experimental scatterometry spectra are collected and compared with the theoretical spectra calculated by the rigorous coupled wave Copyright: American Scientific Publishers analysis (RCWA) algorithm to extract the geometric shape information.…”
Section: Introductionmentioning
confidence: 99%