2011
DOI: 10.1143/apex.4.066701
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Slow Positron Beam Apparatus for Surface and Subsurface Analysis of Samples in Air

Abstract: A technique for investigating atomic-scale defects and/or nanometer (sub-nanometer)-order pores near the surface of samples mounted in air (without vacuum) by positron annihilation spectroscopy (PAS) has been developed. The method relies on the extraction of slow positron beams from the vacuum chamber to air through a thin SiN membrane vacuum window. Using a positron beam with an injection energy of 2.6 keV and a vacuum window with a thickness of 30 nm, samples mounted in air can be investigated by PAS to a de… Show more

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Cited by 15 publications
(19 citation statements)
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“…For the investigation at hand, Teflon AF 1600 was used because Teflon AF 1600 has a very long o-Ps lifetime component of between 5 and 6 ns, and so the large change of this lifetime component in the interphase can be easily detected. 22 In the SiN substrate, no o-Ps is formed, 21 so we can exclude an influence on the measured o-Ps lifetime from the substrate. A schematic of the sample setup and the implantation profile can be seen in Figure 2.…”
Section: ■ Introductionmentioning
confidence: 99%
“…For the investigation at hand, Teflon AF 1600 was used because Teflon AF 1600 has a very long o-Ps lifetime component of between 5 and 6 ns, and so the large change of this lifetime component in the interphase can be easily detected. 22 In the SiN substrate, no o-Ps is formed, 21 so we can exclude an influence on the measured o-Ps lifetime from the substrate. A schematic of the sample setup and the implantation profile can be seen in Figure 2.…”
Section: ■ Introductionmentioning
confidence: 99%
“… is the material density (in g/cm 3 ) and  is the Gamma function. Neglecting backscatter, the transmission through a film of a certain depth can be estimated by integrating this function.…”
Section: Positron Transmission Fractionmentioning
confidence: 99%
“…used to successfully extract slow positrons outside the vacuum chamber [3,4]. Three different windows have been used with the following dimensions; 30 nm  0.6 mm  0.6 mm, 200 nm  1.5 mm  1.5 mm and 500 nm  3.0 mm  3.0 mm.…”
mentioning
confidence: 99%
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