2022
DOI: 10.1038/s41598-022-07654-x
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Small object detection method with shallow feature fusion network for chip surface defect detection

Abstract: The development of intelligent manufacturing often focuses on production flexibility, customization and quality control, which are crucial for chip manufacturing. Specifically, defect detection and classification are important for manufacturing processes in the semiconductor and electronics industries. The intelligent detection methods of chip defects are still challenge and have always been a particular concern of chip processing manufactures in an automated industrial production line. YOLOv4 method has been … Show more

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Cited by 31 publications
(20 citation statements)
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“…For large models, the stochastic gradient(SGD) optimizer is preferred with a Binary Cross Entropy (BCE) loss 47 . Earlier this year, researchers have applied YOLO-based object detection methods for fault diagnostic 48 , 49 .…”
Section: Overview Of Objection Detection Modelsmentioning
confidence: 99%
“…For large models, the stochastic gradient(SGD) optimizer is preferred with a Binary Cross Entropy (BCE) loss 47 . Earlier this year, researchers have applied YOLO-based object detection methods for fault diagnostic 48 , 49 .…”
Section: Overview Of Objection Detection Modelsmentioning
confidence: 99%
“…Compared with YOLO v2, YOLO v3 provides multi-scale features. YOLO v4 was developed for small object detection [ 24 ]. Since the size of CSF lies in a certain range, we did not have the problem of detecting troublesome small objects and chose the YOLO v3 for the current study.…”
Section: Discussionmentioning
confidence: 99%
“…Improved Network Based on YOLO_v3. The shallow feature layer [24] of the neural network (close to the input layer) extracts low-level features. Low-level features are generalized and easy to express such as texture, color, and edges.…”
Section: Improved Ideas Based On Yolo_v3mentioning
confidence: 99%