“…Basic investigations of the ITO/Si SIS structures have been carried out and published in the USA (DuBow et al, 1976;Mizrah et al, 1976;Shewchun et al, 1978; Theoretical and experimental aspects of the processes that take place in these structures are examined in those papers. Later on the investigations of SC based on SIS structures using, as an absorber component, Si, InP and other semiconductor materials have been continued in Japan (Nagatomo et al, 1982;Kobayashi, et al, 1991), India (Vasu & Subrahmanyam, 1992;Vasu et al, 1993), France (Manifacier & Szepessy, 1977;Caldererer et al, 1979), Ukraine (Malik et al, 1979;Malik et al, 1980), Russia (Untila et al, 1998), the USA (Shewchun et al, 1980;Gessert et al, 1990;Gessert et al, 1991), Brasil (Marques & Chambouleyron, 1986) and the Republic of Moldova (Adeeb et al, 1987;Botnariuc et al, 1990;Gagara et al, 1996;Simashkevich et al, 1999). The results of SIS structures fabrication by different methods, especially by pyrolitic pulverization and radiofrequency sputtering, are discussed in those papers.…”