Abstract:Accelerated lifetime testing of power modules is time consuming and expensive due to the destructive nature of the tests. Therefore, it makes sense to extract as much data as possible from each consumed component. Traditional power cycling methods, however, monitor a single parameter and stop the test after this parameter reaches a predefined threshold. This leaves little data available for real-time analysis of the aging process, which instead must take place post-failure. In this paper, we present full resul… Show more
“…Power cycling methodologies where the device is biased with a negative voltage for junction temperature measurement have been proposed in the literature [39,66]. An option to overcome the impact of BTI during power cycling can be the use of fiber optic sensors [67], but its application to condition monitoring will be limited.…”
“…Power cycling methodologies where the device is biased with a negative voltage for junction temperature measurement have been proposed in the literature [39,66]. An option to overcome the impact of BTI during power cycling can be the use of fiber optic sensors [67], but its application to condition monitoring will be limited.…”
“…) depending only on the circulating current and on the state-ofhealth of the bond wires. Regarding T BW , resistance increases below 20% have been reported in [26]. However, a higher resistance increase is expected after a bond wire collapse, and hence its effect on the failure detection is reduced.…”
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