SNOM &amp; Spectroscopy: a Technique Beyond the Diffraction Limit

Marocchi, V.; Cricenti, A.

doi:10.1142/9789812810854_0009

Cited by 1 publication

(1 citation statement)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Near‐Field Raman Imaging is achieved by combining SNOM technology together with a very sensitive, high‐throughput spectroscopic detection system (Anderson et al, ). After focusing the laser light through the SNOM tip and keeping it very close to the surface, an evanescent field is formed at the end of the tip which is able to “excite” only a few nanometers on the sample (the area corresponding to the near field) (Marocchi and Cricenti, ). In the same manner as common Raman spectroscopy, only a very small amount of the light is inelastically scattered and the energy corresponds to characteristic vibrations of the molecules in the sample.…”

Section: Confocal Raman Microscopy (Crm)mentioning

confidence: 99%

Tip in–light on: Advantages, challenges, and applications of combining AFM and Raman microscopy on biological samples

Prats-Mateu

Gierlinger

2016

Microscopy Res & Technique

View full text Add to dashboard Cite

Scanning probe microscopies and spectroscopies, especially AFM and Confocal Raman microscopy are powerful tools to characterize biological materials. They are both non‐destructive methods and reveal mechanical and chemical properties on the micro and nano‐scale. In the last years the interest for increasing the lateral resolution of optical and spectral images has driven the development of new technologies that overcome the diffraction limit of light. The combination of AFM and Raman reaches resolutions of about 50–150 nm in near‐field Raman and 1.7–50 nm in tip enhanced Raman spectroscopy (TERS) and both give a molecular information of the sample and the topography of the scanned surface. In this review, the mentioned approaches are introduced, the main advantages and problems for application on biological samples discussed and some examples for successful experiments given. Finally the potential of colocated AFM and Raman measurements is shown on a case study of cellulose‐lignin films: the topography structures revealed by AFM can be related to a certain chemistry by the colocated Raman scan and additionally the mechanical properties be revealed by using the digital pulsed force mode. Microsc. Res. Tech. 80:30–40, 2017. © 2016 Wiley Periodicals, Inc.

show abstract

Section: Confocal Raman Microscopy (Crm)mentioning

confidence: 99%