Soft Error Reliability Assessment of Lightweight Cryptographic Algorithms for IoT Edge Devices

Rocha, Vinicius Da; Moura, Nicolas; Gava, Jonas; Bandeira, Vitor; Ost, Luciano; Reis, Ricardo; Garibotti, Rafael

doi:10.1109/iscas48785.2022.9937998

Cited by 2 publications

(2 citation statements)

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“…Besides the obviously relevant parameters to take into account, such as silicon area and power consumption in hardware, memory footprint in software and latency and throughput in both forms of implementing LWC algorithms, there are several other considerations for selected fields of application. Examples are the degree of security [15] and the reliability to soft errors [16], [17].…”

Section: Related Work In Soft Error Reliability Ofmentioning

confidence: 99%

“…Except for our pioneering work [16], which uses the SOFIA environment [26] to assess the soft error reliability of ten software-based LWC algorithms, this is the only work considering the execution of LWC algorithms in a resourceconstrained device. This work distinguishes from the previous works in two main aspects:…”

Section: Related Work In Soft Error Reliability Ofmentioning

confidence: 99%

See 1 more Smart Citation

Assessment of Radiation-Induced Soft Errors on Lightweight Cryptography Algorithms Running on a Resource-Constrained Device

Gava

Moura

Lucena

et al. 2023

IEEE Trans. Nucl. Sci.

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Most safety-critical edge-computing devices rely on lightweight cryptography (LWC) algorithms to provide security at minimum power and performance overhead. LWC algorithms are traditionally embedded as a hardware component, but with the advance of the Internet of Things (IoT), emerging firmware is more likely to support cryptography algorithms to comply with different security levels and industry-standards. This is the first work to present the soft error assessment of five cryptography algorithms executing in a low-power microprocessor running under neutron radiation, considering electronic code book (ECB) and counter (CTR) mode of operation implementations. Results obtained from two neutron radiation tests suggest that: (i) the NOEKEON algorithm gives the best relative soft error reliability, performance, power efficiency and memory footprint utilisation trade-offs between the five algorithms considering both ECB and CTR implementations, and (ii) cryptography solutions based on the counter mode of operation present better FIT rate for silent data corruption (SDC) and crash w.r.t. ECB implementations.

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Section: Related Work In Soft Error Reliability Ofmentioning

confidence: 99%

Section: Related Work In Soft Error Reliability Ofmentioning

confidence: 99%