Ion soft‐landing, also often called “preparative mass spectrometry,” is a method that allows the deposition of mass‐selected ions onto surfaces without fragmentation. This technique is usually performed using a conductive deposition target. Generally, charge transfer to the surface results in the neutralization of the deposited ions. However, charge retention of the ions can also occur if the deposited ions are electronically very stable or the surface is covered by an insulating layer. The aim of this article is to introduce the reader to fundamental physical models, including detailed mathematical deviations, which contribute to the understanding of the interaction between a layer of deposited ions and approaching ions. First, a historical overview of the experimental evidence for charge retention of soft‐landed ions is given and the classes of molecular ions predominantly used in these studies are introduced. Subsequently, physical models are introduced, considering the influence of a variety of parameters including surface size, ionic layer size, distance between deposited ions, and thickness of insulating layers. Finally, the effects which become important above the monolayer coverage of ions are discussed.