2023
DOI: 10.1016/j.apsadv.2023.100448
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Soft matter analysis via atomic force microscopy (AFM): A review

A.M. Joshua,
G. Cheng,
E.V. Lau
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Cited by 11 publications
(3 citation statements)
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“…This fact is in agreement with literature data [ 28 ]. Long-term liquid exposure subjects the outermost filler particles to direct contact with the liquid, which tends to infiltrate between the glass fibers and the polymer matrix, causing a significant decrease in surface roughness due to microstructural uniformity implying a smoother surface [ 29 ]. The compactness of the polymer matrix ensures liquid-resistant behavior of the unexposed filler particles and preserves the integrity of the composite sample.…”
Section: Discussionmentioning
confidence: 99%
“…This fact is in agreement with literature data [ 28 ]. Long-term liquid exposure subjects the outermost filler particles to direct contact with the liquid, which tends to infiltrate between the glass fibers and the polymer matrix, causing a significant decrease in surface roughness due to microstructural uniformity implying a smoother surface [ 29 ]. The compactness of the polymer matrix ensures liquid-resistant behavior of the unexposed filler particles and preserves the integrity of the composite sample.…”
Section: Discussionmentioning
confidence: 99%
“…In AFM, one of the natural vibrational resonances (eigenmodes) of a cantilever with a sharp tip, is used to measure the topography of a sample surface, with the spatial resolution primarily dictated by the sharpness of the tip; usually around about 5 nm. 26,27 Advanced techniques like bimodal AFM employ multiple eigenmodes to achieve increased resolution and measure additional properties such as deformation and elastic modulus. 28…”
Section: Introductionmentioning
confidence: 99%
“…However, the accuracy of moduli measurements in a liquid environment may suffer from hydrodynamic forces between the AFM cantilever, probe and analyzed samples. 24 In particular, AFM allows imaging of surface topography, as well as detection and capture of forces between the tip and the sample via peak force quantitative nanomechanical mapping (PF-QNM) mode. PF-QNM is an AFM imaging mode that tracks the surface of the sample while simultaneously acquiring the individual force curves for each intermittent individual tap of the surface of the sample using the AFM tip.…”
Section: Introductionmentioning
confidence: 99%