2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) 2019
DOI: 10.1109/ispsd.2019.8757650
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Soft-Switching Losses in GaN and SiC Power Transistors Based on New Calorimetric Measurements

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Cited by 14 publications
(4 citation statements)
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“…Dynamic calorimetric measurement incorporates a temperature rise monitoring during transient thermal event. The method is attractive The measurement precision of this kind of methods is reported to be comparable with static measurements [6], [7].…”
Section: Calorimetric Measurementmentioning
confidence: 93%
“…Dynamic calorimetric measurement incorporates a temperature rise monitoring during transient thermal event. The method is attractive The measurement precision of this kind of methods is reported to be comparable with static measurements [6], [7].…”
Section: Calorimetric Measurementmentioning
confidence: 93%
“…Current research based on analytical models and experimental comparison shows, that wide bandgap semiconductors, in particular GaN devices, lead to a major efficiency increase in soft-switching applications [18]. In order to select the most suitable semiconductor for the LLC stage, GaN and silicon carbide (SiC) power transistors were characterized with new calorimetric measurements and compared for use in the planned topology [20], [21]. In contrast to conventional characterization using the double-pulse test (DPT) method, the transient Z th -calibrated calorimetric measurement can be used to accurately determine even very small switching loss energy in ZVS operation.…”
Section: B Semiconductor Selectionmentioning
confidence: 99%
“…The two-stage architecture consists of a totempole power factor correction (PFC) stage and an isolated resonant half-bridge LLC converter with synchronous rectification (SR). To enable high switching frequencies for small passive components, this well-established topology [14]- [19] is combined with a semiconductor selection based on new calorimetric measurements of zero-voltage switching (ZVS) losses [20], [21]. Miniaturized half-bridges and a 3D-stacked design of the AC/DC converter allow the compact connection of both stages while maintaining necessary isolation distances.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, it is required to provide detailed measurements and analysis experimentally or by simulation in order to estimate expected behavior for operational conditions of the system. Several approaches, where comparisons on conventional and GaN technology is provided, can be found, while it is being clearly shown, how perspective technology enables to improve specific operational and qualitative indicators of power semiconductor component in [2]- [5].…”
Section: Introductionmentioning
confidence: 99%