2019
DOI: 10.1038/s41598-019-51098-9
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Soft X-ray magnetic scattering studies of 3D magnetic morphology along buried interfaces in NiFe/CoPd/NiFe nanostructures

Abstract: With the continuing interest in new magnetic materials for sensor devices and data storage applications, the community needs reliable and sensitive tools for the characterization of such materials. Soft X-rays tuned to elemental absorption edges are a depth and element sensitive probe of magnetic structure at the nanoscale, and scattering measurements have the potential to provide 3D magnetic structural information of the material. In this work we develop a methodology in transmission geometry that allows one … Show more

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Cited by 6 publications
(15 citation statements)
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“…During the transmission through the sample before and after a reflection event, it is also likely that there are further losses not accounted for by the imaginary part of the refractive index due to diffuse scattering from grain boundaries. Such diffuse scattering was observed in previous work [6,25], and is of increasing importance as the incidence angle approaches 90 degrees (as measured from the normal). The magnitude of this effect is expected to depend on photon energy, angle of incidence, and specific sample fabrication characteristics; and we are of the opinion that a full investigation of this factor is warranted.…”
Section: Iii2 Introduction To the Theme Of Roughness In Simulationssupporting
confidence: 68%
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“…During the transmission through the sample before and after a reflection event, it is also likely that there are further losses not accounted for by the imaginary part of the refractive index due to diffuse scattering from grain boundaries. Such diffuse scattering was observed in previous work [6,25], and is of increasing importance as the incidence angle approaches 90 degrees (as measured from the normal). The magnitude of this effect is expected to depend on photon energy, angle of incidence, and specific sample fabrication characteristics; and we are of the opinion that a full investigation of this factor is warranted.…”
Section: Iii2 Introduction To the Theme Of Roughness In Simulationssupporting
confidence: 68%
“…Over the past 20 years, the field of resonant elastic soft X-ray scattering has widely expanded into a standard tool for the nanometer resolution characterization of magnetic domains in thin film samples [1][2][3][4][5][6][7][8]. However, an important gap in the literature is the lack of a standard protocol for the modelling of resonant scattering, which has limited the degree to which quantitative conclusions may be extracted from experimental data.…”
Section: Ii1 General Backgroundmentioning
confidence: 99%
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“…In the soft X-ray range, reflection and transmission experiments have reported interesting results [10][11][12][13][14] . X-ray magnetic scattering has allowed a detailed characterization of skyrmions in periodic arrays 10,11 and of periodic striped domains in NiFe/CoPd multilayers 12 . In transmission, two-dimensional (2D) magnetization patterns have been extracted from tubular samples acquired at different angles 13 .…”
mentioning
confidence: 99%