2019
DOI: 10.1063/1.5119155
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Soft X-ray spectroscopy with transition-edge sensors at Stanford Synchrotron Radiation Lightsource beamline 10-1

Abstract: We present results obtained with a new soft X-ray spectrometer based on transition-edge sensors (TESs) composed of Mo/Cu bilayers coupled to bismuth absorbers. This spectrometer simultaneously provides excellent energy resolution, high detection efficiency, and broadband spectral coverage. The new spectrometer is optimized for incident X-ray energies below 2 keV. Each pixel serves as both a highly sensitive calorimeter and an X-ray absorber with near unity quantum efficiency. We have commissioned this 240-pixe… Show more

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Cited by 52 publications
(26 citation statements)
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“…Resonant inelastic x-ray scattering (RIXS). Soft XAS and RIXS experiments were conducted at beamline 10-1 at Stanford Synchrotron Radiation Lightsource (SSRL) 54 . More experiment details about the soft x-ray spectroscopic measurements can be found in our previous work 5 .…”
mentioning
confidence: 99%
“…Resonant inelastic x-ray scattering (RIXS). Soft XAS and RIXS experiments were conducted at beamline 10-1 at Stanford Synchrotron Radiation Lightsource (SSRL) 54 . More experiment details about the soft x-ray spectroscopic measurements can be found in our previous work 5 .…”
mentioning
confidence: 99%
“…All the XAS spectra were normalized by the intensity of the incoming beam, which was measured as a drain current on an electrically isolated gold-coated mesh simultaneously. RIXS measurements were performed using a transition edge sensor (TES) spectrometer, which consisted of a 240-channel energy-dispersive detector array 36 , 37 . The energy collected by the TES was calibrated through separate measurements of a reference sample consisting of C, N, O, and various 3d transition metal oxides with known emission energies.…”
Section: Methodsmentioning
confidence: 99%
“…The transition edge sensor (TES) detector housed at beamline 10-1 at the Stanford Synchrotron Radiation Lightsource (SSRL) provides background-free X-ray emission data and electronic structure information of the valence (occupied) and conduction (unoccupied) density of states (DOS) of both the ND and surface moieties. 69,70 Resonant inelastic X-ray scattering or RIXS maps provides the complete DOS with extraction of X-ray emission spectroscopy (XES) data and partial fluorescence yield X-ray absorption spectroscopy (PFY-XAS). XES and PFY-XAS spectra is produced with an integration window with a static emission or excitation energy as highlighted with the dashed white box in Figure 4B.…”
Section: Soft X-ray Spectroscopy Of Nd-oh Nd-br and Nd-nh3mentioning
confidence: 99%