2019
DOI: 10.29218/srmsmaths.v5i1.2
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Software Reliability Growth Modeling Involving Burr Type XII distribution and Fault Removal Efficiency

Abstract: In software reliability analysis various authors have used Burr type XII distribution to model the failure pattern of the system due to its wide variety of flexible shapes. In particular cases it can be reduced to Exponential, Normal, Weibull, Log-logistic, Gamma distributions etc. In proposed paper software reliability growth model has been developed incorporating fault removal efficiency (FRE) and Burr type XII based testing effort function. FRE represents fraction of detected faults which are removed comple… Show more

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