“…In the case of IR analysis of C-dots samples, apart from the evaluation of hydroxyl (-OH) and carbonyl (C=O) functional groups on the C-dots surface [41,49,69,127], IR is also able to examine the doping of heteroatoms into the C-dots framework. Important examples include the identification of the presence of amide/amine (-CN/NH 2 ) [15,20,21,[37][38][39][40][41][42][43][44][45][46], alkyl sulfide (C-S) [33,[46][47][48][49], organosiloxane (Si-OSi/Si-O-C) [89,127,140,141], phosphates (P=O and P-O-R) [38,49,93], and boronic acid (B-O and B-N) [114,142,143] moieties attached on the surface of C-dots, providing evidence for introduction of nitrogen (N), sulfur (S), silicon (Si), phosphorus (P), and boron (B) heteroatoms into Cdots. The merits of this technique for the characterization of surface functionalization of C-dots are being low cost, simple, rapid, and easy for sample preparation.…”