2021
DOI: 10.1021/acsaelm.1c00505
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Solid-State Electrochemical Protonation of SrCoO2.5 into HxSrCoO2.5 (x = 1, 1.5, and 2)

Abstract: Among many transition-metal oxides (TMOs), strontium cobalt oxide (SrCoO x ) is a promising active material for advanced memory devices due to the versatile valence state of cobalt ions. Several SrCoO x -based electrochemical devices have been proposed, but solid-state protonation from SrCoO 2.5 to H x SrCoO 2.5 (x = 1, 1.5, and 2) at room temperature has not been demonstrated thus far due to the absence of an appropriate solid electrolyte. Here, we demonstrate a solid-state electrochemical protonation of SrCo… Show more

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Cited by 10 publications
(28 citation statements)
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“…We attribute this latter phase to hydrogenated H x SrFeO 2.5 , which has been reported once in ionically-gated strontium ferrite [4] as well as in several studies involving the analogous H x S-rCoO 2.5 system. [12][13][14] While we do not quantify the hydrogen content, x, in these films, previous studies with cobaltite films reported an ≈4.2% c-axis lattice parameter expansion on SrTiO 3 substrates upon incorporation of one equivalent of hydrogen, as measured by time-of-flight secondary ion mass spectrometry, [13,55] in excellent agreement with the lattice expansion we observe in these films (3.8%). Future studies could investigate the quantitative hydrogenation of ferrite films by this method.…”
Section: Resultssupporting
confidence: 88%
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“…We attribute this latter phase to hydrogenated H x SrFeO 2.5 , which has been reported once in ionically-gated strontium ferrite [4] as well as in several studies involving the analogous H x S-rCoO 2.5 system. [12][13][14] While we do not quantify the hydrogen content, x, in these films, previous studies with cobaltite films reported an ≈4.2% c-axis lattice parameter expansion on SrTiO 3 substrates upon incorporation of one equivalent of hydrogen, as measured by time-of-flight secondary ion mass spectrometry, [13,55] in excellent agreement with the lattice expansion we observe in these films (3.8%). Future studies could investigate the quantitative hydrogenation of ferrite films by this method.…”
Section: Resultssupporting
confidence: 88%
“…In the ubiquitous field-effect transistor, for example, this is achieved by applying an electric field across a gate insulator interfaced with the active material to modulate the interfacial charge-carrier population. However, due to the high carrier densities and short screening lengths also effective, such as in the case of voltage-driven shuttling of hydrogen [4,[12][13][14][36][37][38] and nitrogen. [39] Importantly, in contrast to electrostatic gating, these electrochemical effects are not limited by an interfacial electrostatic screening length.…”
Section: Introductionmentioning
confidence: 99%
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“…The magnetic behaviors (M−H & M−T curves) demonstrate that the magnetization of the B-SCO film (∼42 nm) is rather weak (Figure 2a) with only small uncompensated magnetic moments and a tiny coercive field, consistent with previous reports. 35,36 By contrast, the M-SCO film has significant ferromagnetism (note that the thickness of M-SCO is approximately 24 nm due to corrosion by an acid). For a freshly prepared M-SCO film, the magnetic hysteresis loop gives the saturated magnetization M S approximately 1.01 μ B / Co (the same order of magnitude as that of the SrCoO In addition to the significant improvement of ferromagnetism, the electrical conductance of M-SCO also shows an abrupt increase than that of B-SCO, as demonstrated by the resistance−temperature (R−T) relationship in Figure 2b.…”
Section: ■ Results and Discussionmentioning
confidence: 99%