“…To determine the crystallinity and molecular packing properties of the highly textured films in the out-of-plane direction, synchrotron radiation X-ray diffraction under specular reflection conditions (SR-XRD) was performed. The SR-XRD curves (Figure b) of films prepared without magnetic alignment and those prepared with static magnetic alignment show obvious (200) and (010) peaks in the out-of-plane direction, which correspond to d -spacing values of 2.44 and 0.39 nm for lamellar stacking and π–π stacking, respectively. ,,− These results confirm that face-on and edge-on crystalline domains were mixed in the solid film, which is consistent with previous reports. ,, Notably, the intensity of (010) diffraction peaks of the two films are nearly identical, suggesting the static magnetic field did not obviously affect the molecular planar alignment in the out-of-plane direction. However, for the HR-HMF alignment films, the (200) diffraction peak disappears, accompanied by a gradual increase in intensity of the (010) diffraction peaks, indicating that the HR-HMF alignment process inhibited the edge-on packing and promoted the face-on packing in the P(NDI2OD-T2) films; that is, the process can effectively enhance the degree of face-on molecular packing.…”