Some observations on the failure locus of npn transistors and its improvement using graded collector structures

Traditionally the position of reliability analysis in the design and production process of electronic circuits is a position of reliability verification. A completed design is checked on reliability aspects and either rejected or accepted for production. This paper describes a method to model physical failure mechanisms within components in such a way that they can be used for reliability optimization, not after, but during the early phase of the design process. Furthermore a prototype of a CAD software tool is described, which can highlight components likely to fail and automatically adjust circuit parameters to improve product reliability.

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Reliability improvement of electronic circuits based on physical failure mechanisms in components

Brombacher

Boer

Bennion

et al. 1991

Quality & Reliability Eng

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Some observations on the failure locus of npn transistors and its improvement using graded collector structures

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Reliability improvement of electronic circuits based on physical failure mechanisms in components

Reliability improvement of electronic circuits based on physical failure mechanisms in components

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