The temperature distributions in the n-type silicon circular plate, excited
by a frequency-modulated light source from one side, are investigated
theoretically in the frequency domain. The influence of the photogenerated
excess carrier density on the temperature distributions is considered with
respect to the sample thickness, surface quality and carrier lifetime. The
presence of the thermalization and non-radiative recombination processes are
taken into account. The existence of the fast and slow heat sources in the
sample is recognized. It is shown that the temperature distribution on sample
surfaces is a sensitive function of an excess carrier density under a bulk
and surface recombination. The most favorable values of surface velocities
ratio and bulk lifetime are established, assigned for a simpler and more
effective analysis of the carrier influence in semiconductors. The
photothermal and photoacoustic transmission detection configuration is
proposed as a most suitable experimental scheme for the investigation of the
excess carrier influence on the silicon surface temperatures. [Project of the
Serbian Ministry of Education, Science and Technological Development, Grant
no. ON171016]