Proceedings of the 24th International Conference on World Wide Web 2015
DOI: 10.1145/2736277.2741125
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Spanning Edge Centrality

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Cited by 32 publications
(3 citation statements)
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“…Effective resistance is a pairwise metric on the vertex set of G, which results from viewing the graph as an electrical network. It relates to uniform spanning trees (Angriman et al 2020), random walks (Lovász 1996), and several centrality measures (Mavroforakis et al 2015;Brandes and Fleischer 2005). In fact, it works similarly as an objective function for k-LRIP-we are just restricted in the search space to a particular focus node.…”
Section: Introductionmentioning
confidence: 99%
“…Effective resistance is a pairwise metric on the vertex set of G, which results from viewing the graph as an electrical network. It relates to uniform spanning trees (Angriman et al 2020), random walks (Lovász 1996), and several centrality measures (Mavroforakis et al 2015;Brandes and Fleischer 2005). In fact, it works similarly as an objective function for k-LRIP-we are just restricted in the search space to a particular focus node.…”
Section: Introductionmentioning
confidence: 99%
“…Effective resistance is a pairwise metric on the vertex set of G, which results from viewing the graph as an electrical network. It relates to uniform spanning trees [3], random walks [38], and several centrality measures [12,40]. In fact, it works similarly as an objective function for k-LRIP -we are just restricted in the search space to a particular focus node.…”
Section: Introductionmentioning
confidence: 99%
“…Apart from the methods discussed in Section 2.3 for 𝜖-approximate PER queries, there exist several techniques for all pairwise ER computation or estimating ER values for all edges in the input graph, as reviewed in the sequel. Fouss et al[24] proposed to calculate the ER value for any node pair in the input graph 𝐺 by first computing the Moore-Penrose pseudoinverse of the Laplacian matrix D − A based on a sparse Cholesky factorization of D − A. Mavroforakis et al[42] utilized the random projection and SDD solvers to approximate the ER values of all edges. In Ref [29],.…”
mentioning
confidence: 99%